Issued Patents All Time
Showing 26–50 of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9972697 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2018-05-15 |
| 9960252 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2018-05-01 |
| 9911597 | Trench metal insulator metal capacitor with oxygen gettering layer | Takashi Ando, Michael P. Chudzik, Aritra Dasgupta, Herbert L. Ho, Donghun Kang +3 more | 2018-03-06 |
| 9754945 | Non-volatile memory device employing a deep trench capacitor | Herbert L. Ho, Donghun Kang | 2017-09-05 |
| 9653534 | Trench metal-insulator-metal capacitor with oxygen gettering layer | Takashi Ando, Michael P. Chudzik, Aritra Dasgupta, Herbert L. Ho, Donghun Kang +3 more | 2017-05-16 |
| 9634116 | Method to improve reliability of high-K metal gate stacks | Takashi Ando, Barry P. Linder, Vijay Narayanan | 2017-04-25 |
| 9599656 | Methods, apparatus and system for voltage ramp testing | Suresh Uppal, Andreas Kerber, William F. McMahon | 2017-03-21 |
| 9484438 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-11-01 |
| 9472643 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-10-18 |
| 9466692 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-10-11 |
| 9443953 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Takashi Ando, Kevin K. Chan, Vijay Narayanan | 2016-09-13 |
| 9391164 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-07-12 |
| 9349832 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Takashi Ando, Kevin K. Chan, Vijay Narayanan | 2016-05-24 |
| 9299802 | Method to improve reliability of high-K metal gate stacks | Takashi Ando, Barry P. Linder, Vijay Narayanan | 2016-03-29 |
| 9275744 | Method of restoring a flash memory in an integrated circuit chip package by addition of heat and an electric field | Jeffrey P. Gambino, Adam J. McPadden, Gary A. Tressler | 2016-03-01 |
| 9171954 | FinFET structure and method to adjust threshold voltage in a FinFET structure | Brian J. Greene, Dechao Guo, Gan Wang, Yanfeng Wang, Keith Kwong Hon Wong | 2015-10-27 |
| 9099393 | Enabling enhanced reliability and mobility for replacement gate planar and FinFET structures | Takashi Ando, Kisik Choi, Wing L. Lai, Vijay Narayanan, Ravikumar Ramachandran | 2015-08-04 |
| 8999831 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2015-04-07 |
| 8932949 | FinFET structure and method to adjust threshold voltage in a FinFET structure | Brian J. Greene, Dechao Guo, Gan Wang, Yanfeng Wang, Keith Kwong Hon Wong | 2015-01-13 |
| 8926805 | Method and apparatus for electroplating on SOI and bulk semiconductor wafers | Veeraraghavan S. Basker, Hariklia Deligianni, Rajarao Jammy, Vamsi K. Paruchuri | 2015-01-06 |
| 8778750 | Techniques for the fabrication of thick gate dielectric | Michael P. Chudzik, Andreas Kerber, Siddarth A. Krishnan, Naim Moumen | 2014-07-15 |
| 8772149 | FinFET structure and method to adjust threshold voltage in a FinFET structure | Brian J. Greene, Dechao Guo, Gan Wang, Yanfeng Wang, Keith Kwong Hon Wong | 2014-07-08 |
| 8766378 | Programmable FETs using Vt-shift effect and methods of manufacture | Qingqing Liang, Yue Liang, Yanfeng Wang | 2014-07-01 |
| 8716807 | Fabrication of devices having different interfacial oxide thickness via lateral oxidation | Jin Cai, Martin M. Frank, Marwan H. Khater | 2014-05-06 |
| 8716118 | Replacement gate structure for transistor with a high-K gate stack | Takashi Ando, Unoh Kwon, Vijay Narayanan | 2014-05-06 |