{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "IBM", "item": "https://www.patentleaderboard.com/company/ibm"}, {"@type": "ListItem", "position": 3, "name": "Daniel S. Vanslette", "item": "https://www.patentleaderboard.com/inventor/fl:da_ln:vanslette-2"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
DV

Daniel S. Vanslette — 23 Patents

IBM: 18 patents #6,142 of 70,183Top 9%
Globalfoundries: 5 patents #673 of 4,424Top 20%
Saint Albans, VT: #7 of 84 inventorsTop 9%
Vermont: #338 of 4,968 inventorsTop 7%
Overall (All Time): #178,160 of 4,157,543Top 5%
23 Patents All Time
Daniel S. Vanslette has been granted 23 US patents while listed as an inventor at IBM. The first was granted in 2001 and the most recent in December 2021. Daniel S. Vanslette ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list Daniel S. Vanslette in Saint Albans, VT, US.

Patents per Year

Patents granted per year, 2001 to 2021Bar chart with a peak of 6 patents in 2016.peak 62001: 1 patents20012004: 1 patents20042005: 2 patents20052011: 3 patents20112012: 3 patents20122014: 3 patents20142015: 1 patents20152016: 6 patents20162018: 1 patents20182021: 2 patents2021

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11195969 Method of forming a metal silicide transparent conductive electrode Jeffrey P. Gambino, Derrick Liu 2021-12-07 $3,115,000
11056610 Method of forming a metal silicide transparent conductive electrode Jeffrey P. Gambino, Derrick Liu 2021-07-06 $5,313,000
10147839 Method of forming a metal silicide transparent conductive electrode Jeffrey P. Gambino, Derrick Liu 2018-12-04 $4,080,000
9455214 Wafer frontside-backside through silicon via Jeffrey C. Maling, Anthony K. Stamper, Zeljka Topic-Beganovic 2016-09-27 $3,712,000
9443764 Method of eliminating poor reveal of through silicon vias Jeffrey C. Maling, Anthony K. Stamper, Zeljka Topic-Beganovic 2016-09-13 $3,651,000
9406562 Integrated circuit and design structure having reduced through silicon via-induced stress Jeffrey P. Bonn, Brent A. Goplen, Brian L. Kinsman, Robert M. Rassel, Edmund J. Sprogis 2016-08-02 $3,259,000
9390969 Integrated circuit and interconnect, and method of fabricating same David A. DeMuynck, Zhong-Xiang He, Daniel R. Miga, Matthew D. Moon, Eric J. White 2016-07-12 $2,207,000
9312426 Structure with a metal silicide transparent conductive electrode and a method of forming the structure Jeffrey P. Gambino, Derrick Liu 2016-04-12 $2,843,000
9245850 Through silicon via wafer, contacts and design structures Jeffrey P. Gambino, Cameron E. Luce, Bucknell C. Webb 2016-01-26 $652,000
9041210 Through silicon via wafer and methods of manufacturing Jeffrey P. Gambino, Jessica A. Levy, Cameron E. Luce, Bucknell C. Webb 2015-05-26 $2,909,000
8918988 Methods for controlling wafer curvature Mohammed Fazil Fayaz, Jeffery B. Maxson, Anthony K. Stamper 2014-12-30 $7,309,000
8809998 Semiconductor device including in wafer inductors, related method and design structure Renata Camillo-Castillo, John J. Ellis-Monaghan, Robert M. Rassel 2014-08-19 $3,895,000
8791016 Through silicon via wafer, contacts and design structures Jeffrey P. Gambino, Cameron E. Luce, Bucknell C. Webb 2014-07-29 $5,690,000
8299615 Methods and structures for controlling wafer curvature Mohammed Fazil Fayaz, Jeffery B. Maxson, Anthony K. Stamper 2012-10-30
8232139 Integrated structures of high performance active devices and passive devices Robert M. Rassel, Anthony K. Stamper 2012-07-31 $5,473,000
8188591 Integrated structures of high performance active devices and passive devices Robert M. Rassel, Anthony K. Stamper 2012-05-29 $10,419,000
8084864 Electromigration resistant aluminum-based metal interconnect structure Jonathan D. Chapple-Sokol, Daniel A. Delibac, Zhong-Xiang He, Tom C. Lee, William J. Murphy +2 more 2011-12-27 $5,499,000
8021943 Simultaneously formed isolation trench and through-box contact for silicon-on-insulator technology Alan B. Botula, BethAnn Rainey 2011-09-20 $5,575,000
8003536 Electromigration resistant aluminum-based metal interconnect structure Jonathan D. Chapple-Sokol, Daniel A. Delibac, Zhong-Xiang He, Tom C. Lee, William J. Murphy +2 more 2011-08-23 $4,386,000
6900505 Method of forming refractory metal contact in an opening, and resulting structure Jonanthan D. Chapple-Sokol, Randy W. Mann, William J. Murphy, Jed H. Rankin 2005-05-31 $8,494,000
6838364 Sputtered tungsten diffusion barrier for improved interconnect robustness Stephen Bruce Brodsky, William J. Murphy, Matthew J. Rutten, David C. Strippe 2005-01-04 $10,543,000
6762121 Method of forming refractory metal contact in an opening, and resulting structure Jonathan D. Chapple-Sokol, Randy W. Mann, William J. Murphy, Jed H. Rankin 2004-07-13 $8,966,000
6245668 Sputtered tungsten diffusion barrier for improved interconnect robustness Stephen Bruce Brodsky, William J. Murphy, Matthew J. Rutten, David C. Strippe 2001-06-12 $30,235,000