Issued Patents All Time
Showing 151–175 of 190 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9966337 | Fully aligned via with integrated air gaps | Lawrence A. Clevenger, Huai Huang, Christopher J. Penny, Michael Rizzolo, Hosadurga Shobha | 2018-05-08 |
| 9953865 | Structure and method to improve FAV RIE process margin and electromigration | Joe Lee, Theodorus E. Standaert | 2018-04-24 |
| 9941134 | Uniform dielectric recess depth during fin reveal | Lawrence A. Clevenger, Michael Rizzolo, Jay William Strane | 2018-04-10 |
| 9941211 | Reducing metallic interconnect resistivity through application of mechanical strain | Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert | 2018-04-10 |
| 9941088 | Fold over emitter and collector field emission transistor | Lawrence A. Clevenger, Michael Rizzolo | 2018-04-10 |
| 9929088 | Airgap protection layer for via alignment | Lawrence A. Clevenger, Christopher J. Penny, Michael Rizzolo | 2018-03-27 |
| 9916986 | Single or mutli block mask management for spacer height and defect reduction for BEOL | Lawrence A. Clevenger, Yann Mignot | 2018-03-13 |
| 9917137 | Integrated magnetic tunnel junction (MTJ) in back end of line (BEOL) interconnects | Michael Rizzolo, Theodorus E. Standaert | 2018-03-13 |
| 9911651 | Skip-vias bypassing a metallization level at minimum pitch | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2018-03-06 |
| 9905459 | Neutral atom beam nitridation for copper interconnect | Lawrence A. Clevenger, Michael Rizzolo, Chih-Chao Yang | 2018-02-27 |
| 9905513 | Selective blocking boundary placement for circuit locations requiring electromigration short-length | Elbert E. Huang, Joe Lee, Christopher J. Penny | 2018-02-27 |
| 9899338 | Structure and fabrication method for enhanced mechanical strength crack stop | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2018-02-20 |
| 9899256 | Self-aligned airgaps with conductive lines and vias | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2018-02-20 |
| 9881833 | Barrier planarization for interconnect metallization | Elbert E. Huang, Takeshi Nogami, Raghuveer R. Patlolla, Cornelius Brown Peethala, David L. Rath | 2018-01-30 |
| 9881431 | Security key system | Lawrence A. Clevenger, Bartlet H. DeProspo, Michael Rizzolo | 2018-01-30 |
| 9858388 | Health monitoring using parallel cognitive processing | Maryam Ashoori, Lawrence A. Clevenger, Leigh Anne H. Clevenger, Jonathan H. Connell, II, Nalini K. Ratha +1 more | 2018-01-02 |
| 9837305 | Forming deep airgaps without flop over | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2017-12-05 |
| 9837350 | Semiconductor interconnect structure with double conductors | Takeshi Nogami, Raghuveer R. Patlolla | 2017-12-05 |
| 9837355 | Method for maximizing air gap in back end of the line interconnect through via landing modification | Lawrence A. Clevenger, Christopher J. Penny, Michael Rizzolo | 2017-12-05 |
| 9837485 | High-density MIM capacitors | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2017-12-05 |
| 9824982 | Structure and fabrication method for enhanced mechanical strength crack stop | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2017-11-21 |
| 9806023 | Selective and non-selective barrier layer wet removal | Elbert E. Huang, Raghuveer R. Patlolla, Cornelius Brown Peethala, David L. Rath, Hosadurga Shobha | 2017-10-31 |
| 9793206 | Heterogeneous metallization using solid diffusion removal of metal interconnects | Lawrence A. Clevenger, Bartlet H. DeProspo, Huai Huang, Christopher J. Penny, Michael Rizzolo | 2017-10-17 |
| 9780035 | Structure and method for improved stabilization of cobalt cap and/or cobalt liner in interconnects | James J. Kelly, Koichi Motoyama, Roger A. Quon, Michael Rizzolo, Theodorus E. Standaert | 2017-10-03 |
| 9778007 | Matching a spent firearm cartridge | Lawrence A. Clevenger, Bartlet H. DeProspo, Michael Rizzolo | 2017-10-03 |