AR

Alexander Reznicek

IBM: 1182 patents #3 of 70,183Top 1%
Globalfoundries: 77 patents #21 of 4,424Top 1%
ET Elpis Technologies: 9 patents #2 of 121Top 2%
GU Globalfoundries U.S.: 4 patents #206 of 665Top 35%
Samsung: 3 patents #30,683 of 75,807Top 45%
TE Tessera: 3 patents #129 of 271Top 50%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
MT Matheson Tri-Gas: 1 patents #28 of 47Top 60%
IB International Business: 1 patents #4 of 119Top 4%
IM International Machines: 1 patents #1 of 34Top 3%
AS Adeia Semiconductor Solutions: 1 patents #22 of 57Top 40%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
📍 Troy, NY: #1 of 610 inventorsTop 1%
🗺 New York: #2 of 115,490 inventorsTop 1%
Overall (All Time): #40 of 4,157,543Top 1%
1279
Patents All Time

Issued Patents All Time

Showing 676–700 of 1,279 patents

Patent #TitleCo-InventorsDate
9966457 Transistor structure with varied gate cross-sectional area Dominic J. Schepis, Pranita Kerber, Qiqing C. Ouyang 2018-05-08
9966387 Strain release in pFET regions Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz, Darsen D. Lu, Kern Rim 2018-05-08
9966374 Semiconductor device with gate structures having low-K spacers on sidewalls and electrical contacts therebetween Kangguo Cheng, Ali Khakifirooz, Charan V. Surisetty 2018-05-08
9960240 Low resistance contact structures for trench structures Praneet Adusumilli, Oscar van der Straten, Chih-Chao Yang 2018-05-01
9954116 Electrostatically enhanced fins field effect transistors Kangguo Cheng, Bruce B. Doris, Pouya Hashemi, Ali Khakifirooz 2018-04-24
9954106 III-V fin on insulator Kangguo Cheng, Hemanth Jagannathan 2018-04-24
9954103 Bottom spacer formation for vertical transistor Oleg Gluschenkov, Sanjay C. Mehta, Shogo Mochizuki 2018-04-24
9954102 Vertical field effect transistor with abrupt extensions at a bottom source/drain structure Shogo Mochizuki 2018-04-24
9954083 Semiconductor structures having increased channel strain using fin release in gate regions Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz, Darsen D. Lu, Kern Rim 2018-04-24
9954058 Self-aligned air gap spacer for nanosheet CMOS devices Shogo Mochizuki, Joshua M. Rubin, Junli Wang 2018-04-24
9954050 Precise/designable FinFET resistor structure Praneet Adusumilli, Shanti Pancharatnam, Oscar van der Straten 2018-04-24
9953973 Diode connected vertical transistor Karthik Balakrishnan, Pouya Hashemi 2018-04-24
9953884 Field effect transistor including strained germanium fins Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi 2018-04-24
9947778 Lateral bipolar junction transistor with controlled junction Karthik Balakrishnan, Pouya Hashemi, Tak H. Ning 2018-04-17
9947775 Replacement III-V or germanium nanowires by unilateral confined epitaxial growth Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi 2018-04-17
9947689 Semiconductor device structure with 110-PFET and 111-NFET current flow direction Pouya Hashemi, Ali Khakifirooz, Shogo Mochizuki 2018-04-17
9947675 Mask-programmable ROM using a vertical FET integration process Karthik Balakrishnan, Pouya Hashemi, Tak H. Ning 2018-04-17
9947649 Large area electrostatic dischage for vertical transistor structures Karthik Balakrishnan, Pouya Hashemi, Jeng-Bang Yau 2018-04-17
9947621 Structure and method to reduce copper loss during metal cap formation Praneet Adusumilli, Oscar van der Straten 2018-04-17
9947532 Forming zig-zag trench structure to prevent aspect ratio trapping defect escape Judson R. Holt, Shogo Mochizuki, Melissa A. Smith 2018-04-17
9941391 Method of forming vertical transistor having dual bottom spacers Oleg Gluschenkov, Sanjay C. Mehta, Shogo Mochizuki 2018-04-10
9941370 Vertical field-effect-transistors having multiple threshold voltages Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi 2018-04-10
9941302 Structure and method to form defect free high-mobility semiconductor fins on insulator Veeraraghavan S. Basker, Oleg Gluschenkov, Shogo Mochizuki 2018-04-10
9941204 III-V compatible anti-fuses Praneet Adusumilli, Oscar van der Straten, Chih-Chao Yang 2018-04-10
9935186 Method of manufacturing SOI lateral Si-emitter SiGe base HBT Pouya Hashemi, Tak H. Ning 2018-04-03