Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7924038 | Probe and electrical connecting apparatus using it | Yuji Miyagi | 2011-04-12 |
| 7736690 | Method for manufacturing an electrical test probe | Hideki Hirakawa, Yuko Yamada, Yosuke YOSHIZAWA, Takayuki Hayashizaki, Akira Soma | 2010-06-15 |
| 7679389 | Probe for electrical test and electrical connecting apparatus using it | Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki | 2010-03-16 |
| 7667472 | Probe assembly, method of producing it and electrical connecting apparatus | Kiyotoshi Miura, Hidehiro Kiyofuji, Yuji Miyagi, Hitoshi Sato | 2010-02-23 |
| 7629807 | Electrical test probe | Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki, Masahisa Tazawa | 2009-12-08 |
| 7586316 | Probe board mounting apparatus | Hidehiro Kiyofuji, Yuji Miyagi, Kiyotoshi Miura | 2009-09-08 |
| 7586321 | Electrical test probe and electrical test probe assembly | Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki | 2009-09-08 |
| 7557593 | Probe for electrical test and probe assembly | Hideki Hirakawa, Akira Souma, Takayuki Hayashizaki | 2009-07-07 |
| 7523539 | Method of manufacturing a probe | Takayuki Hayashizaki, Hideki Hirakawa, Akira Soma | 2009-04-28 |
| 7375037 | Fabrication method for semiconductor integrated circuit device | Kazuo Yamazaki, Kousuke Kusakari, Takenobu Ikeda, Masahiro Tadokoro | 2008-05-20 |
| 6633072 | Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device | Kazuo Yamazaki, Kousuke Kusakari, Takenobu Ikeda, Masahiro Tadokoro | 2003-10-14 |
| 6479392 | Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device | Kazuo Yamazaki, Kousuke Kusakari, Takenobu Ikeda, Masahiro Tadokoro | 2002-11-12 |
| 5497331 | Semiconductor integrated circuit device fabrication method and its fabrication apparatus | Nobuyuki Iriki, Tsutomu Okabe, Kenji Watanabe, Hisashi Maejima | 1996-03-05 |
| 5115456 | Mask for exposing wafer with radiation and its exposing method | Takeshi Kimura, Akihiko Kishimoto, Takashi Soga | 1992-05-19 |
| 4964146 | Pattern transistor mask and method of using the same | Takeshi Kumura | 1990-10-16 |
| 4933565 | Method and apparatus for correcting defects of X-ray mask | Hiroshi Yamaguchi, Keiya Saito, Mitsuyoshi Koizumi, Akira Shimase, Satoshi Haraichi +2 more | 1990-06-12 |
| 4925755 | Method of correcting defect in circuit pattern | Hiroshi Yamaguchi, Keiya Saito, Akira Shimase, Satoshi Haraichi, Susumu Aiuchi +2 more | 1990-05-15 |
| 4737973 | Crystal monochromator | Taro Ogawa, Yoshinori Nakayama, Takeshi Kimura | 1988-04-12 |
| 4719161 | Mask for X-ray lithography and process for producing the same | Takeshi Kimura, Kozo Mochiji, Hiroshi Okamoto, Takao Iwayanagi, Tetsuichi Kudo | 1988-01-12 |
| 4690529 | Optical exposer | Shuji Sugiyama, Shuji Syohda | 1987-09-01 |
| 4614432 | Pattern detector | Tsuneo Terasawa, Toshiei Kurosaki, Yoshio Kawamura, Sumio Hosaka, Akihiro Takanashi | 1986-09-30 |
| 4597669 | Pattern detector | Tsuneo Terasawa, Akihiro Takanashi, Toshiei Kurosaki, Yoshio Kawamura, Sumio Hosaka | 1986-07-01 |
| 4504726 | Pattern generator | Sumio Hosaka, Akihiro Takanashi, Toshiei Kurosaki, Yoshio Kawamura, Tsuneo Terasawa | 1985-03-12 |
| 4480910 | Pattern forming apparatus | Akihiro Takanashi, Tatsuo Harada, Masamoto Akeyama, Yataro Kondo, Toshiei Kurosaki +2 more | 1984-11-06 |
| 4477183 | Automatic focusing apparatus | Yoshio Kawamura, Akihiro Takanashi, Toshiei Kurosaki, Sumio Hosaka, Tsuneo Terasawa | 1984-10-16 |