Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12000867 | Electrical connecting device | Akihisa Akahira, Hisao Narita, Mizuho KON, Kenichi Suto | 2024-06-04 |
| 11378591 | Electrical connection device | Kenichi Tsuruta, Koichiro Tokumaru, Miyuki Tomooka | 2022-07-05 |
| 10859599 | Electrical connection apparatus | Hisao Narita | 2020-12-08 |
| 10768207 | Electrical connection device | — | 2020-09-08 |
| 9435854 | Electrical contactor and contact method for the same | Mika Nasu, Akihiro Karouji | 2016-09-06 |
| 8975908 | Electrical test probe and probe assembly with improved probe tip | Akira Soma, Hideki Hirakawa | 2015-03-10 |
| 8063651 | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same | Shoji Kamata, Tomoya Sato, Toshinaga Takeya | 2011-11-22 |
| 7888958 | Current test probe having a solder guide portion, and related probe assembly and production method | Akira Souma, Yoshikazu Urushiyama, Masahisa Tazawa, Tomoya Sato, Hideki Hirakawa | 2011-02-15 |
| 7862733 | Method for manufacturing a probe | Hideki Hirakawa, Akira Soma, Kazuhito Hamada | 2011-01-04 |
| 7816931 | Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact | Hideki Hirakawa, Akira Soma, Yuko Yamada | 2010-10-19 |
| 7736690 | Method for manufacturing an electrical test probe | Hideki Hirakawa, Yuko Yamada, Yosuke YOSHIZAWA, Akira Soma, Shinji Kuniyoshi | 2010-06-15 |
| 7721429 | Method for manufacturing a probe | Akira Soma, Yosuke YOSHIZAWA, Hideki Hirakawa | 2010-05-25 |
| 7679389 | Probe for electrical test and electrical connecting apparatus using it | Shinji Kuniyoshi, Hideki Hirakawa, Akira Soma | 2010-03-16 |
| 7629807 | Electrical test probe | Hideki Hirakawa, Akira Soma, Shinji Kuniyoshi, Masahisa Tazawa | 2009-12-08 |
| 7586321 | Electrical test probe and electrical test probe assembly | Hideki Hirakawa, Akira Soma, Shinji Kuniyoshi | 2009-09-08 |
| 7557593 | Probe for electrical test and probe assembly | Hideki Hirakawa, Akira Souma, Shinji Kuniyoshi | 2009-07-07 |
| 7523539 | Method of manufacturing a probe | Hideki Hirakawa, Akira Soma, Shinji Kuniyoshi | 2009-04-28 |