Issued Patents All Time
Showing 1–25 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9568500 | Electrical test probe | Yuko Kanazawa | 2017-02-14 |
| 8975908 | Electrical test probe and probe assembly with improved probe tip | Takayuki Hayashizaki, Akira Soma | 2015-03-10 |
| 8671567 | Method for manufacturing a probe for an electrical test | Satoshi Kaizuka | 2014-03-18 |
| 7983912 | Apparatus, method, and computer program product for correcting a misrecognized utterance using a whole or a partial re-utterance | Tetsuro Chino | 2011-07-19 |
| 7960988 | Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor | Yoshiyuki Fukami, Kazuya Numajiri, Osamu Arai | 2011-06-14 |
| 7888958 | Current test probe having a solder guide portion, and related probe assembly and production method | Akira Souma, Yoshikazu Urushiyama, Masahisa Tazawa, Tomoya Sato, Takayuki Hayashizaki | 2011-02-15 |
| 7862733 | Method for manufacturing a probe | Takayuki Hayashizaki, Akira Soma, Kazuhito Hamada | 2011-01-04 |
| 7816931 | Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact | Takayuki Hayashizaki, Akira Soma, Yuko Yamada | 2010-10-19 |
| 7747871 | Information recording apparatus, information reproducing apparatus, and information distribution system | Toru Kambayashi, Koichiro Akiyama, Shuichi Tsujimoto, Kazuo Sumita, Toshihiro Sugaya | 2010-06-29 |
| 7736690 | Method for manufacturing an electrical test probe | Yuko Yamada, Yosuke YOSHIZAWA, Takayuki Hayashizaki, Akira Soma, Shinji Kuniyoshi | 2010-06-15 |
| 7721429 | Method for manufacturing a probe | Akira Soma, Takayuki Hayashizaki, Yosuke YOSHIZAWA | 2010-05-25 |
| 7679389 | Probe for electrical test and electrical connecting apparatus using it | Shinji Kuniyoshi, Akira Soma, Takayuki Hayashizaki | 2010-03-16 |
| 7629807 | Electrical test probe | Akira Soma, Takayuki Hayashizaki, Shinji Kuniyoshi, Masahisa Tazawa | 2009-12-08 |
| 7586321 | Electrical test probe and electrical test probe assembly | Akira Soma, Takayuki Hayashizaki, Shinji Kuniyoshi | 2009-09-08 |
| 7557593 | Probe for electrical test and probe assembly | Akira Souma, Takayuki Hayashizaki, Shinji Kuniyoshi | 2009-07-07 |
| 7523539 | Method of manufacturing a probe | Takayuki Hayashizaki, Akira Soma, Shinji Kuniyoshi | 2009-04-28 |
| 7343495 | Information recording apparatus, information reproducing apparatus, and information distribution system | Toru Kambayashi, Koichiro Akiyama, Shuichi Tsujimoto, Kazuo Sumita, Toshihiro Sugaya | 2008-03-11 |
| 7209942 | Information providing method and apparatus, and information reception apparatus | Osamu Hori, Miwako Doi, Kazuo Sumita | 2007-04-24 |
| 7065708 | Displaying multiple ranked document abstracts in a single hyperlinked abstract, and their modified source documents | Kenji Ono, Kazuo Sumita | 2006-06-20 |
| 6742163 | Displaying multiple document abstracts in a single hyperlinked abstract, and their modified source documents | Kenji Ono, Kazuo Sumita | 2004-05-25 |
| 6581207 | Information filtering system and method | Kazuo Sumita, Miwako Doi, Osamu Hori | 2003-06-17 |
| 6477649 | Information recording apparatus, information reproducing apparatus, and information distribution system | Toru Kambayashi, Koichiro Akiyama, Shuichi Tsujimoto, Kazuo Sumita, Toshihiro Sugaya | 2002-11-05 |
| 6282508 | Dictionary management apparatus and a dictionary server | Kazuhiro Kimura, Akira Kumano | 2001-08-28 |
| 6035338 | Document browse support system and document processing system | Kazuhiro Kimura | 2000-03-07 |
| 5963941 | Information collection system connected to a communication network for collecting desired information in a desired form | — | 1999-10-05 |