Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379398 | Measurement system | Michitaka Okuta, Hisao Narita | 2025-08-05 |
| D1087034 | Electric contact | Yasutaka Kishi | 2025-08-05 |
| D1086075 | Electric contact | Yasutaka Kishi | 2025-07-29 |
| 11971296 | Measurement system and measurement method | Michitaka Okuta, Yuki Saito, Hisao Narita, Shou Harako, Jukiya Fukushi +1 more | 2024-04-30 |
| 11624679 | Optical probe, optical probe array, test system and test method | Michitaka Okuta, Yuki Saito, Shou Harako, Jukiya Fukushi, Minoru Sato +1 more | 2023-04-11 |
| 9015934 | Method for manufacturing probe card | — | 2015-04-28 |
| 9015935 | Method for manufacturing probe card | — | 2015-04-28 |
| 8063651 | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same | Shoji Kamata, Tomoya Sato, Takayuki Hayashizaki | 2011-11-22 |