Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097761 | Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus | Katsuo Yasuta | 2015-08-04 |
| 7924038 | Probe and electrical connecting apparatus using it | Shinji Kuniyoshi | 2011-04-12 |
| 7667472 | Probe assembly, method of producing it and electrical connecting apparatus | Kiyotoshi Miura, Hidehiro Kiyofuji, Shinji Kuniyoshi, Hitoshi Sato | 2010-02-23 |
| 7602200 | Probe for electrical test comprising a positioning mark and probe assembly | Tetsuya Iwabuchi | 2009-10-13 |
| 7586316 | Probe board mounting apparatus | Shinji Kuniyoshi, Hidehiro Kiyofuji, Kiyotoshi Miura | 2009-09-08 |
| 7525329 | Electrical connecting apparatus | Kiyotoshi Miura, Hidehiro Kiyofuji, Akihisa Akahira, Tatsuo Inoue | 2009-04-28 |
| 7468610 | Electrical connecting apparatus | Hidehiro Kiyofuji, Akihisa Akahira, Yoshinori Kikuchi | 2008-12-23 |
| 7449906 | Probe for testing an electrical device | Kiyotoshi Miura, Akihisa Akahira | 2008-11-11 |
| 6498504 | Wafer inspection device and wafer inspection method | — | 2002-12-24 |