Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11428727 | Prober | Mamoru Aruga | 2022-08-30 |
| 9146256 | Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling device | Hikaru Masuta, Hideki Nei, Tatsuya Ishiwatari | 2015-09-29 |
| 9097761 | Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus | Yuji Miyagi | 2015-08-04 |
| 9069008 | Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodes | Hikaru Masuta, Hideki Nei | 2015-06-30 |
| 8471586 | Wafer prober for semiconductor inspection and inspection method | Kenichi Washio, Umenori Sugiyama, Hikaru Masuta | 2013-06-25 |
| 8278965 | Inspection apparatus | Kenichi Washio, Toshikazu Oshima, Takehiko Hirai | 2012-10-02 |
| 7719300 | Method for testing a semiconductor wafer and apparatus thereof | Kenichi Washio, Umenori Sugiyama | 2010-05-18 |