Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9910089 | Inspection unit, probe card, inspection device, and control system for inspection device | Norie Yamaguchi | 2018-03-06 |
| 8525539 | Electrical connecting apparatus and testing system using the same | Masashi Hasegawa | 2013-09-03 |
| 8471586 | Wafer prober for semiconductor inspection and inspection method | Katsuo Yasuta, Umenori Sugiyama, Hikaru Masuta | 2013-06-25 |
| 8278965 | Inspection apparatus | Katsuo Yasuta, Toshikazu Oshima, Takehiko Hirai | 2012-10-02 |
| 8253433 | Testing apparatus for integrated circuit | Masashi Hasegawa | 2012-08-28 |
| 7719300 | Method for testing a semiconductor wafer and apparatus thereof | Katsuo Yasuta, Umenori Sugiyama | 2010-05-18 |