Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9910089 | Inspection unit, probe card, inspection device, and control system for inspection device | Kenichi Washio | 2018-03-06 |
| 9207260 | Probe block, probe card and probe apparatus both having the probe block | Takashi Ogasawara | 2015-12-08 |
| 8699035 | Inspection apparatus and inspection method for light emitting device | Syu Jimbo, Keita Koyahara | 2014-04-15 |
| 6271674 | Probe card | Yoshiei Hasegawa, Yukihiro Hirai, Tadashi Sugiyama, Takahiko Tandai, Satoshi Narita | 2001-08-07 |