YH

Yoshiei Hasegawa

NM Nihon Micronics: 14 patents #4 of 171Top 3%
Overall (All Time): #299,333 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
8721372 Contact and electrical connecting apparatus 2014-05-13
7764073 Electrical connecting apparatus 2010-07-27
7728608 Method for assembling electrical connecting apparatus 2010-06-01
7559773 Electrical connecting apparatus 2009-07-14
7532020 Probe assembly Masashi Hasegawa 2009-05-12
7377788 Electrical connecting apparatus and contact 2008-05-27
7255575 Electrical connecting apparatus 2007-08-14
7165975 Electrical connecting apparatus Masayoshi Hasegawa, Eichi Osato 2007-01-23
6672877 Contactor block and apparatus for electrical connection 2004-01-06
6657448 Electrical connection apparatus 2003-12-02
6595794 Electrical contact method and apparatus in semiconductor device inspection equipment 2003-07-22
6271674 Probe card Yukihiro Hirai, Tadashi Sugiyama, Takahiko Tandai, Norie Yamaguchi, Satoshi Narita 2001-08-07
6019612 Electrical connecting apparatus for electrically connecting a device to be tested Eichi Osato 2000-02-01
5982184 Test head for integrated circuits 1999-11-09
5888075 Auxiliary apparatus for testing device Eichi Osato 1999-03-30
4563640 Fixed probe board 1986-01-07