Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8471586 | Wafer prober for semiconductor inspection and inspection method | Kenichi Washio, Katsuo Yasuta, Hikaru Masuta | 2013-06-25 |
| 7719300 | Method for testing a semiconductor wafer and apparatus thereof | Kenichi Washio, Katsuo Yasuta | 2010-05-18 |