MN

Minori Noguchi

HI Hitachi: 63 patents #147 of 28,497Top 1%
HH Hitachi High-Technologies: 62 patents #8 of 1,917Top 1%
HC Hitachi High-Tech Electronics Engineering Co.: 6 patents #1 of 59Top 2%
RT Renesas Technology: 6 patents #492 of 3,337Top 15%
HC Hitachi Electronics Engineering Co.: 5 patents #5 of 175Top 3%
CU Columbia University: 1 patents #1,151 of 2,492Top 50%
HI Hitach: 1 patents #1 of 68Top 2%
📍 Joso, JP: #1 of 46 inventorsTop 3%
Overall (All Time): #11,094 of 4,157,543Top 1%
114
Patents All Time

Issued Patents All Time

Showing 101–114 of 114 patents

Patent #TitleCo-InventorsDate
5333495 Method and apparatus for processing a minute portion of a specimen Hiroshi Yamaguchi, Makiko Kohno, Toshihiko Nakata 1994-08-02
5329333 Exposure apparatus and method Yukio Kenbo, Yoshitada Oshida, Masataka Shiba, Yasuhiro Yoshitaka, Makoto Murayama 1994-07-12
5302999 Illumination method, illumination apparatus and projection exposure apparatus Yoshitada Oshida, Tutomu Tawa, Yukihiro Shibata, Shigemi Ishii, Tsuneo Terasawa +1 more 1994-04-12
5274434 Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line Hiroshi Morioka, Yoshimasa Ohshima, Yukio Kembo, Yuzo Taniguchi 1993-12-28
5233191 Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process Yukio Kembo, Hiroshi Morioka, Hiroshi Yamaguchi, Makiko Kohno, Yoshimasa Ohshima 1993-08-03
5214282 Method and apparatus for processing a minute portion of a specimen Hiroshi Yamaguchi, Makiko Kohno, Toshihiko Nakata 1993-05-25
5098191 Method of inspecting reticles and apparatus therefor Hiroaki Shishido, Mitsuyoshi Koizumi, Nobuyuki Akiyama, Toshihilo Nakata 1992-03-24
RE33424 Apparatus and method for measuring the depth of fine engraved patterns Toru Otsubo, Susumu Aiuchi 1990-11-06
4952058 Method and apparatus for detecting abnormal patterns Hiroaki Shishido, Mitsuyoshi Koizumi 1990-08-28
4922308 Method of and apparatus for detecting foreign substance Mitsuyoshi Koizumi, Hiroaki Shishido, Sachio Uto, Yoshimasa Ohshima 1990-05-01
4840487 Measuring apparatus for etching pits Toru Otsubo, Susumu Aiuchi 1989-06-20
4744660 Apparatus for measuring difference in shallow level Toru Otsubo, Susumu Aiuchi 1988-05-17
4615620 Apparatus for measuring the depth of fine engraved patterns Toru Otsubo, Susumu Aiuchi 1986-10-07
4487678 Dry-etching apparatus Toru Otsubo, Susumu Aiuchi, Takashi Kamimura, Teru Fujii 1984-12-11