Issued Patents All Time
Showing 76–97 of 97 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6703850 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2004-03-09 |
| 6613593 | Method of fabricating a semiconductor device | Masahiro Watanabe, Kenji Watanabe, Mari Nozoe, Hiroshi Miyai | 2003-09-02 |
| 6587581 | Visual inspection method and apparatus therefor | Yukio Matsuyama, Yuji Takagi, Takashi Hiroi, Asahiro Kuni, Junzou Azuma +2 more | 2003-07-01 |
| 6583634 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2003-06-24 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2003-05-06 |
| 6559459 | Convergent charged particle beam apparatus and inspection method using same | Masahiro Watanabe, Takashi Hiroi, Hiroyuki Shinada, Taku Ninomiya | 2003-05-06 |
| 6436516 | Information seal | Takeshi Nagashima | 2002-08-20 |
| 6376854 | Method of inspecting a pattern on a substrate | Chie Shishido, Takashi Hiroi, Haruo Yoda, Masahiro Watanabe, Asahiro Kuni +8 more | 2002-04-23 |
| 6373054 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama, Yuji Takagi +3 more | 2002-04-16 |
| 6347150 | Method and system for inspecting a pattern | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Hiroyuki Shinada, Mari Nozoe +2 more | 2002-02-12 |
| 6335532 | Convergent charged particle beam apparatus and inspection method using same | Masahiro Watanabe, Takashi Hiroi, Hiroyuki Shinada, Taku Ninomiya | 2002-01-01 |
| 6333510 | Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatus | Masahiro Watanabe, Takashi Hiroi, Hiroyuki Shinada, Yasutsugu Usami | 2001-12-25 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-12-11 |
| 6236057 | Method of inspecting pattern and apparatus thereof with a differential brightness image detection | Chie Shishido, Takashi Hiroi, Haruo Yoda, Masahiro Watanabe, Asahiro Kuni +8 more | 2001-05-22 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-01-09 |
| 6172365 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama, Yuji Takagi +3 more | 2001-01-09 |
| 6107637 | Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus | Masahiro Watanabe, Takashi Hiroi, Hiroyuki Shinada, Yasutsugu Usami | 2000-08-22 |
| 6087673 | Method of inspecting pattern and apparatus thereof | Chie Shishido, Takashi Hiroi, Haruo Yoda, Masahiro Watanabe, Asahiro Kuni +8 more | 2000-07-11 |
| 5986263 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama, Yuji Takagi +3 more | 1999-11-16 |
| 5116953 | Method for thermally treating lactoferrin | Shunichi Dosako, Rika Shinooka | 1992-05-26 |
| 5098722 | Method of manufacturing iron-fortified beverage | Teiichi Tojima, Shun-ichi Dousako, Kiyoshi Tatsumi | 1992-03-24 |
| 5008120 | Method of preparing iron-fortified beverage | Teiichi Tojima, Shun-ichi Dousako, Kiyoshi Tatsumi | 1991-04-16 |