Issued Patents All Time
Showing 26–50 of 123 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8729805 | Plasma generator and discharge device and reactor using plasma generator | Takashige Yagi, Shingo Sato | 2014-05-20 |
| 8648300 | Charged particle beam apparatus | Miki Isawa, Minoru Yamazaki, Yuzuru Mizuhara, Hideyuki Kazumi | 2014-02-11 |
| 8630142 | Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage | Koji Nii, Shigeki Obayashi, Koichiro Ishibashi, Hirofumi Shinohara | 2014-01-14 |
| 8586920 | Charged particle beam apparatus | Natsuki Tsuno | 2013-11-19 |
| 8502141 | Graphical user interface for use with electron beam wafer inspection | Masaki Hasegawa, Hisaya Murakoshi | 2013-08-06 |
| 8474574 | Sound absorbing structure | Hisaaki Kobayashi, Yasuhiro Suzuki, Takahiro Ogo | 2013-07-02 |
| 8420539 | Additive for polishing composition | Masashi Teramoto, Ryoko Higashigaki | 2013-04-16 |
| 8405025 | Scanning electron microscope and method for detecting an image using the same | Toshifumi Honda | 2013-03-26 |
| 8308972 | Additive for polishing composition | Masashi Teramoto, Ryoko Higashigaki | 2012-11-13 |
| 8218390 | Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage | Koji Nii, Shigeki Obayashi, Koichiro Ishibashi, Hirofumi Shinohara | 2012-07-10 |
| 8193493 | Charged particle beam apparatus | Sayaka Tanimoto, Hiroya Ohta, Ryuichi Funatsu | 2012-06-05 |
| 8193350 | Fluorescent compound and labeling agent comprising the same | Koji Suzuki, Keitaro Umezawa, Daniel Citterio | 2012-06-05 |
| 8009500 | Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage | Koji Nii, Shigeki Obayashi, Koichiro Ishibashi, Hirofumi Shinohara | 2011-08-30 |
| 7982188 | Apparatus and method for wafer pattern inspection | Hiroyuki Shinada, Hisaya Murakoshi, Hideo Todokoro, Yoshihiro Anan | 2011-07-19 |
| 7906761 | Charged particle beam apparatus | Sayaka Tanimoto, Hiroya Ohta, Ryuichi Funatsu | 2011-03-15 |
| 7880143 | Electron beam apparatus | Sayaka Tanimoto, Hiroya Ohta, Ryuichi Funatsu | 2011-02-01 |
| 7860592 | Design method for industrial product using clothoid curve, industrial products designed by the design method, and method and device for numerical control using the clothoid curve | Fumihiko Kimura, Yoshikazu Matsuo | 2010-12-28 |
| 7755776 | Inspection system and inspection method | Masaki Hasegawa, Momoyo Enyama | 2010-07-13 |
| 7728294 | Semiconductor wafer inspection tool and semiconductor wafer inspection method | Takashi Hiroi, Kenji Tanimoto, Yuko Sasaki | 2010-06-01 |
| 7683319 | Charge control apparatus and measurement apparatus equipped with the charge control apparatus | Zhaohui Cheng, Kenji Tanimoto, Hideo Todokoro | 2010-03-23 |
| 7655906 | Method and apparatus for scanning and measurement by electron beam | Zhaohui Cheng, Hikaru Koyama, Mitsugu Sato | 2010-02-02 |
| 7652248 | Inspection apparatus and inspection method | Kenji Tanimoto, Zhaohui Cheng, Hikaru Koyama | 2010-01-26 |
| 7589566 | Semiconductor device provided with antenna ratio countermeasure circuit | Shigeki Ohbayashi, Hiroaki Suzuki, Koichiro Ishibashi | 2009-09-15 |
| 7566871 | Method and apparatus for pattern inspection | Masaki Hasegawa, Hisaya Murakoshi | 2009-07-28 |
| 7547884 | Pattern defect inspection method and apparatus thereof | Masaki Hasegawa, Hikaru Koyama, Zhaohui Cheng, Hisaya Murakoshi | 2009-06-16 |