PB

Peter Baars

Globalfoundries: 81 patents #20 of 4,424Top 1%
QA Qimonda Ag: 13 patents #13 of 575Top 3%
GU Globalfoundries U.S.: 9 patents #67 of 665Top 15%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
📍 Dresden, DE: #3 of 3,254 inventorsTop 1%
Overall (All Time): #12,665 of 4,157,543Top 1%
107
Patents All Time

Issued Patents All Time

Showing 51–75 of 107 patents

Patent #TitleCo-InventorsDate
9123568 Encapsulation of closely spaced gate electrode structures Richard J. Carter, Andy Wei 2015-09-01
9034753 Method of forming conductive contacts on a semiconductor device with embedded memory and the resulting device Till Schloesser 2015-05-19
9023696 Method of forming contacts for devices with multiple stress liners Marco Lepper, Thilo Scheiper 2015-05-05
8987104 Method of forming spacers that provide enhanced protection for gate electrode structures Sven Beyer, Jan Hoentschel, Thilo Scheiper 2015-03-24
8946821 SRAM integrated circuits and methods for their fabrication Matthias Goldbach 2015-02-03
8927407 Method of forming self-aligned contacts for a semiconductor device Andy Wei, Erik Geiss, Martin Mazur 2015-01-06
8921904 Replacement gate fabrication methods Matthias Goldbach 2014-12-30
8916433 Superior integrity of high-k metal gate stacks by capping STI regions Thilo Scheiper, Sven Beyer 2014-12-23
8883586 Mol insitu Pt rework sequence Marco Lepper, Uwe Kahler, Vivien Schroeder 2014-11-11
8859356 Method of forming metal silicide regions on a semiconductor device Hans-Juergen Thees 2014-10-14
8853810 Integrated circuits that include deep trench capacitors and methods for their fabrication Till Schloesser 2014-10-07
8846513 Semiconductor device comprising replacement gate electrode structures and self-aligned contact elements formed by a late contact fill Richard J. Carter, Rolf Stephan 2014-09-30
8835245 Semiconductor device comprising self-aligned contact elements Till Schloesser, Frank Jakubowski, Andy Wei, Richard J. Carter, Matthias Schaller 2014-09-16
8790975 Semiconductor device comprising a capacitor formed in the metallization system based on dummy metal features Till Schloesser, Vivien Schroeder 2014-07-29
8765586 Methods of forming metal silicide regions on semiconductor devices Clemens Fitz, Markus Lenski 2014-07-01
8742510 Semiconductor devices with replacement gate structures having conductive contacts positioned therebetween Andy Wei, Richard J. Carter 2014-06-03
8735232 Methods for forming semiconductor devices Matthias Goldbach 2014-05-27
8722523 Semiconductor device comprising self-aligned contact elements and a replacement gate electrode structure Till Schloesser, Frank Jakubowski 2014-05-13
8716126 Semiconductor device comprising self-aligned contact bars and metal lines with increased via landing regions Thomas Werner, Frank Feustel 2014-05-06
8716077 Replacement gate compatible eDRAM transistor with recessed channel Till Schloesser, Frank Jakubowski 2014-05-06
8697557 Method of removing gate cap materials while protecting active area Till Schloesser, Frank Jakubowski 2014-04-15
8673696 SOI semiconductor device comprising a substrate diode with reduced metal silicide leakage Frank Jakubowski, Jens Heinrich, Marco Lepper, Jana Schlott, Kai Frohberg 2014-03-18
8652889 Fin-transistor formed on a patterned STI region by late fin etch Andy Wei, Richard J. Carter, Frank Ludwig 2014-02-18
8647938 SRAM integrated circuits with buried saddle-shaped FINFET and methods for their fabrication Matthias Goldbach 2014-02-11
8647952 Encapsulation of closely spaced gate electrode structures Richard J. Carter, Andy Wei 2014-02-11