AY

Akio Yamada

Fujitsu Limited: 49 patents #280 of 24,456Top 2%
AD Advantest: 23 patents #18 of 1,193Top 2%
DD Ddk: 13 patents #7 of 97Top 8%
NE Nec: 12 patents #1,037 of 14,502Top 8%
TC Toyo Machinery & Metal Co.: 4 patents #2 of 31Top 7%
DK Daiichi Denshi Kogyo Kabushiki Kaisha: 4 patents #4 of 50Top 8%
IN Intel: 3 patents #10,349 of 30,777Top 35%
FL Fujitsu Vlsi Limited: 3 patents #28 of 256Top 15%
WS Webasto Se: 2 patents #95 of 401Top 25%
WC Webasto Japan Co.: 2 patents #4 of 16Top 25%
NK Nihon Kohden: 1 patents #238 of 467Top 55%
IC Ishikawajima-Harima Heavy Industries Co.: 1 patents #251 of 611Top 45%
DE Denso: 1 patents #6,940 of 11,792Top 60%
HA Hospal Ag: 1 patents #9 of 36Top 25%
NA Nec Laboratories America: 1 patents #215 of 412Top 55%
📍 Tokyo, CA: #62 of 583 inventorsTop 15%
Overall (All Time): #10,365 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 51–75 of 118 patents

Patent #TitleCo-InventorsDate
6881968 Electron beam exposure apparatus, electron beam exposure method, semiconductor device manufacturing method, and electron beam shape measuring method 2005-04-19
6869319 Misconnection-proof key and connector using the same Kazuyuki Ozai, Shinya Ishizuka, Kazuhiro Sato 2005-03-22
6776637 Panel mounted electrical connector movable relative to the panel Kazuyuki Ozai, Hitoshi Kikuchi 2004-08-17
6623441 Blood-purifying apparatus and artificial kidney using the same Kazuhiko Kihara 2003-09-23
6579265 Artificial kidney and an insertion guide used therein Kazuhiko Kihara 2003-06-17
6414325 Charged particle beam exposure apparatus and exposure method capable of highly accurate exposure in the presence of partial unevenness on the surface of exposed specimen Tatsuro Ohkawa 2002-07-02
6361382 Terminal assembly providing a space for inserting a cable Takaharu Kouda, Manabu Hayakawa 2002-03-26
6252344 Electron gun used in an electron beam exposure apparatus Yoshihisa Ooae, Takamasa Satoh, Hiroshi Yasuda 2001-06-26
6222195 Charged-particle-beam exposure device and charged-particle-beam exposure method Satoru Sagou, Hitoshi Watanabe, Satoru Yamazaki, Kiichi Sakamoto, Manabu Ohno +2 more 2001-04-24
6175121 Block mask and charged particle beam exposure method and apparatus using the same Hiroshi Yasuda 2001-01-16
6137111 Charged particle-beam exposure device and charged-particle-beam exposure method Satoru Sagou, Hitoshi Watanabe, Satoru Yamazaki, Kiichi Sakamoto, Manabu Ohno +2 more 2000-10-24
6015975 Method and apparatus for charged particle beam exposure Kenichi Kawakami, Masahiko Susa, Kobayashi Katsuhiko, Koichi Yamashita, Naoki Nishio 2000-01-18
5981960 Charged particle beam exposure method and apparatus therefor Yoshihisa Ooaeh, Hiroshi Yasuda, Hitoshi Tanaka 1999-11-09
5965895 Method of providing changed particle beam exposure in which representative aligning marks on an object are detected to calculate an actual position to perform exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1999-10-12
5949078 Charged-particle-beam exposure device and charged-particle-beam exposure method Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Kenj Kudoh, Kouzi Takahata 1999-09-07
5895924 Charged particle beam exposure method and apparatus Hiroshi Yasuda, Kazushi Ishida, Tohru Ikeda, Kouzi Takahata 1999-04-20
5892237 Charged particle beam exposure method and apparatus Kenichi Kawakami, Hiroshi Yasuda, Tatsuro Ohkawa, Mitsuhiro Nakano, Atsushi Saito +1 more 1999-04-06
5872366 Charged-particle-beam exposure device and charged-particle-beam exposure method Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Kenj Kudoh, Kouzi Takahata 1999-02-16
5854490 Charged-particle-beam exposure device and charged-particle-beam exposure method Yoshihisa Ooaeh, Hiroshi Yasuda 1998-12-29
5849436 Block mask and charged particle beam exposure method and apparatus using the same Hiroshi Yasuda 1998-12-15
5841145 Method of and system for exposing pattern on object by charged particle beam Takamasa Satoh, Yoshihisa Oae, Soichiro Arai, Kenichi Miyazawa, Hiroshi Yasuda +5 more 1998-11-24
5830612 Method of detecting a deficiency in a charged-particle-beam exposure mask Satoru Sagou, Hitoshi Watanabe, Satoru Yamazaki, Kiichi Sakamoto, Manabu Ohno +2 more 1998-11-03
5808313 Charged particle beam exposure method and charged particle beam exposure apparatus Hiroshi Yasuda, Hidefumi Yabara, Atsushi Saito 1998-09-15
5721432 Method of and system for charged particle beam exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1998-02-24
5719402 Method of and system for charged particle beam exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1998-02-17