RE

Ramin Emami

Applied Materials: 21 patents #612 of 7,310Top 9%
Overall (All Time): #210,686 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8133096 Multi-phase polishing pad Robert Lum, Sourabh Mishra 2012-03-13
7497767 Vibration damping during chemical mechanical polishing Hung Chih Chen, Shijian Li, John M. White, Fred C. Redeker, Steven M. Zuniga +1 more 2009-03-03
7331847 Vibration damping in chemical mechanical polishing system Hung Chih Chen, John M. White, Shijian Li, Fred C. Redeker 2008-02-19
7273813 Wafer cleaning solution for cobalt electroless application Timothy Weidman, Sergey Lopatin, Hongbin Fang, Arulkumar Shanmugasundram 2007-09-25
7256111 Pretreatment for electroless deposition Sergey Lopatin, Arulkumar Shanmugasundram, Hongbin Fang 2007-08-14
7104267 Planarized copper cleaning for reduced defects Shijian Li, Sen-Hou Ko, Fred C. Redeker, Madhavi R. Chandrachood 2006-09-12
7041599 High through-put Cu CMP with significantly reduced erosion and dishing Shijian Li, Fred C. Redeker, John M. White 2006-05-09
7014538 Article for polishing semiconductor substrates Lawrence Rosenberg, Shijian Li, Manoocher Birang, John M. White, Marty Scales +1 more 2006-03-21
7014545 Vibration damping in a chemical mechanical polishing system Hung Chih Chen, John M. White, Shijian Li, Fred C. Redeker 2006-03-21
6857941 Multi-phase polishing pad Robert Lum, Sourabh Mishra 2005-02-22
6832948 Thermal preconditioning fixed abrasive articles Manoocher Birang, Shijian Li, Fred C. Redeker 2004-12-21
6786996 Apparatus and method for edge bead removal 2004-09-07
6708701 Capillary ring 2004-03-23
6676497 Vibration damping in a chemical mechanical polishing system Hung Chih Chen, John M. White, Shijian Li, Fred C. Redeker 2004-01-13
6669538 Pad cleaning for a CMP system Shijian Li, Sen-Hou Ko, Shi-Ping Wang, Fred C. Redeker, Lizhong Sun +1 more 2003-12-30
6656842 Barrier layer buffing after Cu CMP Shijian Li, Fred C. Redeker, Sen-Hou Ko, John M. White 2003-12-02
6592439 Platen for retaining polishing material Shijian Li, Manoocher Birang, Andrew J. Nagengast, Douglas Orcutt Brown, Shi-Ping Wang +2 more 2003-07-15
6432826 Planarized Cu cleaning for reduced defects Shijian Li, Sen-Hou Ko, Fred C. Redeker, Madhavi R. Chandrachood 2002-08-13
6413873 System for chemical mechanical planarization Shijian Li, John M. White, Lawrence Rosenberg, Martin Scales, James V. Tietz +1 more 2002-07-02
6322427 Conditioning fixed abrasive articles Shijian Li, Sidney P. Huey, Fritz Redeker, John M. White 2001-11-27
6299698 Wafer edge scrubber and method Brian J. Brown 2001-10-09