Issued Patents All Time
Showing 25 most recent of 167 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12220270 | Imaging systems and methods for image-guided radiosurgery | Younes Achkire, Raymond Wilbur, John R. Adler, Radhika Mohan Bodduluri, Hui Zhang +4 more | 2025-02-11 |
| 11844637 | Therapeutic radiation beam detector for radiation treatment systems | Cesare Jenkins, Younes Achkire, Raymond Wilbur, John R. Adler, Radhika Mohan Bodduluri +4 more | 2023-12-19 |
| 11826582 | Revolving radiation collimator | Raymond Wilbur, Younes Achkire | 2023-11-28 |
| 11058892 | Revolving radiation collimator | Raymond Wilbur, Younes Achkire | 2021-07-13 |
| 10499861 | Self-shielded, integrated-control radiosurgery system | Younes Achkire, Raymond Wilbur, John R. Adler, Radhika Mohan Bodduluri, Hui Zhang +4 more | 2019-12-10 |
| 10105811 | Eddy current system having an elongated core for in-situ profile measurement | G. Laurie Miller, Boguslaw A. Swedek | 2018-10-23 |
| 10029497 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2018-07-24 |
| 9789715 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2017-10-17 |
| 9656491 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2017-05-23 |
| 9550383 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2017-01-24 |
| 9333621 | Polishing pad for endpoint detection and related methods | Boguslaw A. Swedek | 2016-05-10 |
| 9302513 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2016-04-05 |
| 9120344 | Apparatus and method for control of print gap | Robert B. Lowrance, Michael Miller, Sass Somekh, Conor F. Madigan, Eliyahu Vronsky | 2015-09-01 |
| 8858298 | Polishing pad with two-section window having recess | Boguslaw A. Swedek | 2014-10-14 |
| 8795029 | Apparatus and method for in-situ endpoint detection for semiconductor processing operations | Nils Johansson, Allan Gleason | 2014-08-05 |
| 8758086 | Friction sensor for polishing system | Gabriel L. Miller, Nils Johansson, Boguslaw A. Swedek, Dominic J. Benvegnu | 2014-06-24 |
| 8556679 | Substrate polishing metrology using interference signals | Grigory Pyatigorsky | 2013-10-15 |
| 8506356 | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations | Nils Johansson, Allan Gleason | 2013-08-13 |
| 8485862 | Polishing pad for endpoint detection and related methods | Boguslaw A. Swedek | 2013-07-16 |
| 8460057 | Computer-implemented process control in chemical mechanical polishing | Boguslaw A. Swedek, Bret W. Adams, Sanjay Rajaram, David A. Chan | 2013-06-11 |
| 8342906 | Friction sensor for polishing system | Gabriel L. Miller, Nils Johansson, Boguslaw A. Swedek, Dominic J. Benvegnu | 2013-01-01 |
| 8216441 | Electrophoretic solar cell metallization process and apparatus | Kapila Wijekoon, Alexander Sou-Kang Ko, Eugene Rabinovich | 2012-07-10 |
| 8092274 | Substrate polishing metrology using interference signals | Grigory Pyatigorsky | 2012-01-10 |
| 7999540 | Eddy current apparatus and method for in-situ profile measurement | G. Laurie Miller, Boguslaw A. Swedek | 2011-08-16 |
| 7971489 | Carbon nanotube-based load cells | Victor L. Pushparaj, Omkaram Nalamasu | 2011-07-05 |