EG

Ezra Robert Gold

Applied Materials: 22 patents #582 of 7,310Top 8%
SS Sensity Systems: 2 patents #6 of 12Top 50%
AC Applied Micro Circuits: 1 patents #192 of 311Top 65%
VP Volex Plc: 1 patents #7 of 20Top 35%
Overall (All Time): #141,471 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
12237682 Efficient hierarchical distributed power storage Robert Fanfelle 2025-02-25
11359769 Gas cartridge loaded dispensing device Robert Fanfelle 2022-06-14
9848474 Lighting nodes having a core node and sensor pods Kent W. Ryhorchuk, Carlos Henriquez, David Vucich, Shin-Li Cecily Liu 2017-12-19
9587789 Methods and apparatus for providing a gas mixture to a pair of process chambers Jared Ahmad Lee, Martin Jeffrey Salinas, James P. Cruse 2017-03-07
9565732 Lighting nodes having a core node and sensor pods Kent W. Ryhorchuk, Carlos Henriquez, David Vucich, Shin-Li Cecily Liu 2017-02-07
9155134 Methods and apparatus for rapidly responsive heat control in plasma processing devices Chunlei Zhang, Richard Fovell, Ajit Balakrishna, James P. Cruse 2015-10-06
9088357 Imaging system for passive alignment of engines Benoit Sevigny 2015-07-21
8931512 Gas delivery system and method of use thereof James P. Cruse, John W. Lane 2015-01-13
8895889 Methods and apparatus for rapidly responsive heat control in plasma processing devices Chunlei Zhang, Richard Fovell, Ajit Balakrishna, James P. Cruse 2014-11-25
8616043 Methods and apparatus for calibrating pressure gauges in a substrate processing system James P. Cruse, Jared Ahmad Lee, Ming Xu 2013-12-31
8616224 Methods and apparatus for providing a gas mixture to a pair of process chambers Jared Ahmad Lee, Martin Jeff Salinas, James P. Cruse 2013-12-31
8562742 Apparatus for radial delivery of gas to a chamber and methods of use thereof Jared Ahmad Lee, Martin Jeff Salinas, Ankur Agarwal, James P. Cruse, Aniruddha Pal +1 more 2013-10-22
8231799 Plasma reactor apparatus with multiple gas injection zones having time-changing separate configurable gas compositions for each zone Kallol Bera, Xiaoye Zhao, Kenny L. Doan, Paul Brillhart, Bruno Geoffrion +2 more 2012-07-31
8074677 Method and apparatus for controlling gas flow to a processing chamber Richard Fovell, James P. Cruse, Jared Ahmad Lee, Bruno Geoffrion, Douglas A. Buchberger, Jr. +1 more 2011-12-13
8048806 Methods to avoid unstable plasma states during a process transition Michael Kutney, Daniel J. Hoffman, Gerardo Delgadino, Ashok Sinha, Xiaoye Zhao +2 more 2011-11-01
7975558 Method and apparatus for gas flow measurement Jared Ahmad Lee, Chunlei Zhang, James P. Cruse, Richard Fovell 2011-07-12
7910013 Method of controlling a chamber based upon predetermined concurrent behavior of selected plasma parameters as a function of source power, bias power and chamber pressure Daniel J. Hoffman 2011-03-22
7901952 Plasma reactor control by translating desired values of M plasma parameters to values of N chamber parameters Daniel J. Hoffman 2011-03-08
7846497 Method and apparatus for controlling gas flow to a processing chamber Richard Fovell, James P. Cruse, Jared Ahmad Lee, Bruno Geoffrion, Douglas A. Buchberger, Jr. +1 more 2010-12-07
7795153 Method of controlling a chamber based upon predetermined concurrent behavior of selected plasma parameters as a function of selected chamber parameters Daniel J. Hoffman 2010-09-14
7775236 Method and apparatus for controlling gas flow to a processing chamber Richard Fovell, James P. Cruse, Jared Ahmad Lee, Bruno Geoffrion, Douglas A. Buchberger, Jr. +1 more 2010-08-17
7743670 Method and apparatus for gas flow measurement Jared Lee, Chunlei Zhang, James P. Cruse, Richard Fovell 2010-06-29
7541292 Plasma etch process with separately fed carbon-lean and carbon-rich polymerizing etch gases in independent inner and outer gas injection zones Kallol Bera, Xiaoye Zhao, Kenny L. Doan, Paul Brillhart, Bruno Geoffrion +2 more 2009-06-02
7540971 Plasma etch process using polymerizing etch gases across a wafer surface and additional polymer managing or controlling gases in independently fed gas zones with time and spatial modulation of gas content Kallol Bera, Xiaoye Zhao, Kenny L. Doan, Paul Brillhart, Bruno Geoffrion +2 more 2009-06-02
7470626 Method of characterizing a chamber based upon concurrent behavior of selected plasma parameters as a function of source power, bias power and chamber pressure Daniel J. Hoffman 2008-12-30