Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
HF

H. Jim Fulford

AMAMD: 260 patents #3 of 9,279Top 1%
TLTokyo Electron Limited: 95 patents #9 of 5,567Top 1%
Micron: 2 patents #3,728 of 6,345Top 60%
Marianna, FL: #1 of 21 inventorsTop 5%
Florida: #10 of 67,251 inventorsTop 1%
Overall (All Time): #830 of 4,157,543Top 1%
359 Patents All Time

Issued Patents All Time

Showing 201–225 of 359 patents

Patent #TitleCo-InventorsDate
6103559 Method of making disposable channel masking for both source/drain and LDD implant and subsequent gate fabrication Mark I. Gardner, Derick J. Wristers 2000-08-15
6104063 Multiple spacer formation/removal technique for forming a graded junction Mark I. Gardner, Derick J. Wristers 2000-08-15
6100146 Method of forming trench transistor with insulative spacers Mark I. Gardner, Robert Dawson, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-08-08
6100173 Forming a self-aligned silicide gate conductor to a greater thickness than junction silicide structures using a dual-salicidation process Mark I. Gardner, Charles E. May 2000-08-08
6097062 Optimized trench edge formation integrated with high quality gate formation Mark I. Gardner, Derick J. Wristers 2000-08-01
6096643 Method of fabricating a semiconductor device having polysilicon line with extended silicide layer Homi E. Nariman, Charles E. May 2000-08-01
6096639 Method of forming a local interconnect by conductive layer patterning Robert Dawson, Mark I. Gardner, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-08-01
6093611 Oxide liner for high reliability with reduced encroachment of the source/drain region Mark I. Gardner, Derick J. Wristers 2000-07-25
6090676 Process for making high performance MOSFET with scaled gate electrode thickness Mark I. Gardner, Charles E. May 2000-07-18
6091149 Dissolvable dielectric method and structure Fred N. Hause, Basab Bandyopadhyay, Robert Dawson, Mark W. Michael, William S. Brennan 2000-07-18
6091105 Method of making a self-aligned dopant enhanced RTA MOSFET Mark I. Gardner 2000-07-18
6090703 Method of forming an integrated circuit having conductors of enhanced cross-sectional area with etch stop barrier layer Basab Bandyopadhyay, William S. Brennan, Fred N. Hause, Robert Dawson, Mark W. Michael 2000-07-18
6087705 Trench isolation structure partially bound between a pair of low K dielectric structures Mark I. Gardner, Charles E. May 2000-07-11
6087706 Compact transistor structure with adjacent trench isolation and source/drain regions implanted vertically into trench walls Robert Dawson, Mark I. Gardner, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-07-11
6087238 Semiconductor device having reduced-width polysilicon gate and non-oxidizing barrier layer and method of manufacture thereof Mark I. Gardner 2000-07-11
6083846 Graded MOS transistor junction formed by aligning a sequence of implants to a selectively removable polysilicon sidewall space and oxide thermally grown thereon Mark I. Gardner, Fred N. Hause 2000-07-04
6080629 Ion implantation into a gate electrode layer using an implant profile displacement layer Mark I. Gardner, Robert Dawson, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-06-27
6078078 V-gate transistor Mark I. Gardner, Charles E. May 2000-06-20
6077749 Method of making dual channel gate oxide thickness for MOSFET transistor design Mark I. Gardner, Charles E. May 2000-06-20
6074906 Complementary metal-oxide semiconductor device having source/drain regions formed using multiple spacers Jon D. Cheek, Derick J. Wristers 2000-06-13
6072192 Test structure responsive to electrical signals for determining lithographic misalignment of vias relative to electrically active elements Mark I. Gardner, Fred N. Hause 2000-06-06
6066885 Subtrench conductor formed with large tilt angle implant Robert Dawson 2000-05-23
6064102 Semiconductor device having gate electrodes with different gate insulators and fabrication thereof Mark I. Gardner, Thomas E. Spikes, Jr. 2000-05-16
6060369 Nitrogen bearing sacrificial oxide with subsequent high nitrogen dopant profile for high performance MOSFET Mark I. Gardner, Derick J. Wristers 2000-05-09
6060345 Method of making NMOS and PMOS devices with reduced masking steps Frederick N. Hause, Robert Dawson, Mark I. Gardner, Mark W. Michael, Bradley T. Moore +1 more 2000-05-09