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USPTO Patent Rankings Data through Sept 30, 2025
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Alexander Reznicek — 137 Patents in 2019

IBM: 136 patents #3 of 11,143Top 1%
Globalfoundries: 1 patents #333 of 837Top 40%
Troy, NY: #1 of 70 inventorsTop 2%
New York: #3 of 13,137 inventorsTop 1%
Overall (2019): #25 of 560,194Top 1%
137 Patents 2019

Issued Patents 2019

Showing 76–100 of 137 patents

Patent #TitleCo-InventorsDate
10283601 Strained silicon germanium fin with block source/drain epitaxy and improved overlay capacitance Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi 2019-05-07
10276714 Twin gate field effect diode Karthik Balakrishnan, Pouya Hashemi, Bahman Hekmatshoartabari 2019-04-30
10276569 Minimizing shorting between FinFET epitaxial regions Kangguo Cheng, Balasubramanian Pranatharthiharan, Charan V. Surisetty 2019-04-30
10269698 Binary metallization structure for nanoscale dual damascene interconnects Oscar van der Straten, Praneet Adusumilli, Koichi Motoyama 2019-04-23
10269869 High-density field-enhanced ReRAM integrated with vertical transistors Takashi Ando, Pouya Hashemi 2019-04-23
10269710 Multi-level metallization interconnect structure Praneet Adusumilli, Oscar van der Straten 2019-04-23
10269652 Vertical transistor top epitaxy source/drain and contact structure Oleg Gluschenkov, Sanjay C. Mehta, Shogo Mochizuki 2019-04-23
10262904 Vertical transistor top epitaxy source/drain and contact structure Oleg Gluschenkov, Sanjay C. Mehta, Shogo Mochizuki 2019-04-16
10262900 Wimpy device by selective laser annealing Kangguo Cheng, Nicolas Loubet, Xin Miao 2019-04-16
10256301 Nanosheet isolated source/drain epitaxy by surface treatment and incubation delay 2019-04-09
10256327 Forming a fin using double trench epitaxy Veeraraghavan S. Basker, Pouya Hashemi, Shogo Mochizuki 2019-04-09
10256317 Vertical transistor gated diode Karthik Balakrishnan 2019-04-09
10256230 Co-fabrication of vertical diodes and fin field effect transistors on the same substrate Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi 2019-04-09
10249622 Epitaxial oxide fin segments to prevent strained semiconductor fin end relaxation Karthik Balakrishnan, Keith E. Fogel, Sivananda K. Kanakasabapathy 2019-04-02
10249724 Low resistance contact structures for trench structures Praneet Adusumilli, Oscar van der Straten, Chih-Chao Yang 2019-04-02
10249630 Structure featuring ferroelectric capacitance in interconnect level for steep sub-threshold complementary metal oxide semiconductor transistors Takashi Ando, Karthik Balakrishnan, Pouya Hashemi 2019-04-02
10249501 Single process for liner and metal fill Praneet Adusumilli, Oscar van der Straten, Chih-Chao Yang 2019-04-02
10243043 Self-aligned air gap spacer for nanosheet CMOS devices Shogo Mochizuki, Joshua M. Rubin, Junli Wang 2019-03-26
10243065 Method of manufacturing SOI lateral Si-emitter SiGe base HBT Pouya Hashemi, Tak H. Ning 2019-03-26
10243044 FinFETs with high quality source/drain structures Kangguo Cheng, Ali Khakifirooz, Charan V. Surisetty 2019-03-26
10242990 Structure featuring ferroelectric capacitance in interconnect level for steep sub-threshold complementary metal oxide semiconductor transistors Takashi Ando, Karthik Balakrishnan, Pouya Hashemi 2019-03-26
10236360 Method of forming vertical transistor having dual bottom spacers Oleg Gluschenkov, Sanjay C. Mehta, Shogo Mochizuki 2019-03-19
10236384 Formation of FinFET junction Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, John A. Ott 2019-03-19
10236217 Stacked field-effect transistors (FETs) with shared and non-shared gates Takashi Ando, Pouya Hashemi, Choonghyun Lee, Jingyun Zhang 2019-03-19
10229921 Structure featuring ferroelectric capacitance in interconnect level for steep sub-threshold complementary metal oxide semiconductor transistors Takashi Ando, Karthik Balakrishnan, Pouya Hashemi 2019-03-12