WF

Warren M. Farnworth

Micron: 760 patents #3 of 6,345Top 1%
AI Aptina Imaging: 7 patents #36 of 332Top 15%
RR Round Rock Research: 3 patents #66 of 239Top 30%
📍 Nampa, ID: #1 of 306 inventorsTop 1%
🗺 Idaho: #2 of 8,810 inventorsTop 1%
Overall (All Time): #113 of 4,157,543Top 1%
778
Patents All Time

Issued Patents All Time

Showing 501–525 of 778 patents

Patent #TitleCo-InventorsDate
6333555 Interconnect for semiconductor components and method of fabrication Salman Akram 2001-12-25
6331736 Utilization of die repattern layers for die internal connections Kevin G. Duesman 2001-12-18
6329828 Method and apparatus for capacitively testing a semiconductor die Salman Akram 2001-12-11
6329637 Method and process of contract to a heat softened solder ball array David R. Hembree 2001-12-11
6329709 Interconnections for a semiconductor device Walter L. Moden, Larry D. Kinsman 2001-12-11
6329712 High density flip chip memory arrays Salman Akram, Alan G. Wood 2001-12-11
6329829 Interconnect and system for making temporary electrical connections to semiconductor components Salman Akram 2001-12-11
6326245 Method and apparatus for fabricating electronic device Kevin G. Duesman, Alan G. Wood 2001-12-04
6325057 Complete blade and wafer handling and support system without tape 2001-12-04
6325058 Complete blade and wafer handling and support system without tape 2001-12-04
6325271 Continuous mode solder jet apparatus 2001-12-04
6326697 Hermetically sealed chip scale packages formed by wafer level fabrication and assembly 2001-12-04
6320397 Molded plastic carrier for testing semiconductor dice Alan G. Wood, David R. Hembree 2001-11-20
6319354 System and method for dicing semiconductor components Alan G. Wood 2001-11-20
6319065 Method and apparatus for forming modular sockets using flexible interconnects and resulting structures David J. Corisis, Salman Akram 2001-11-20
6316823 LOC semiconductor assembled with room temperature adhesive Ford B. Grigg 2001-11-13
6316839 Mask repattern process 2001-11-13
6313651 Carrier and system for testing bumped semiconductor components David R. Hembree, Alan G. Wood, Derek Gochnour, Salman Akram 2001-11-06
6313658 Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer William K. Waller, Leland R. Nevill, Raymond J. Beffa, Eugene H. Cloud 2001-11-06
6307394 Test carrier with variable force applying mechanism for testing semiconductor components Salman Akram, James M. Wark, Derek Gochnour 2001-10-23
6304355 Modulation and demodulation of light to facilitate transmission of information 2001-10-16
6296171 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, Michael E. Hess, John O. Jacobson, Alan G. Wood 2001-10-02
6297660 Test carrier with variable force applying mechanism for testing semiconductor components Salman Akram, James M. Wark, Derek Gochnour 2001-10-02
6297542 Connecting a die in an integrated circuit module Larry D. Kinsman, Walter L. Moden 2001-10-02
6294837 Semiconductor interconnect having laser machined contacts Salman Akram, Alan G. Wood 2001-09-25