TD

Trung T. Doan

Micron: 363 patents #8 of 6,345Top 1%
SC Semileds Optoelectronics Co.: 41 patents #2 of 28Top 8%
Applied Materials: 14 patents #962 of 7,310Top 15%
SE Semileds: 12 patents #1 of 18Top 6%
RR Round Rock Research: 5 patents #35 of 239Top 15%
SC Shin-Etsu Chemical Co.: 3 patents #839 of 2,176Top 40%
U.S. Philips: 2 patents #2,537 of 8,851Top 30%
SC Semi-Photonics Co.: 1 patents #3 of 8Top 40%
📍 Huoshaolun, CA: #1 of 1 inventorsTop 100%
Overall (All Time): #477 of 4,157,543Top 1%
448
Patents All Time

Issued Patents All Time

Showing 351–375 of 448 patents

Patent #TitleCo-InventorsDate
5863603 Liquid vapor deposition or etching method Gurtej S. Sandhu 1999-01-26
5858877 Self-aligned process for making contacts to silicon substrates during the manufacture of integrated circuits therein Charles H. Dennison 1999-01-12
5854102 Vertical diode structures with low series resistance Fernando Gonzalez, Tyler Lowrey, Raymond A. Turi, Graham R. Wolstenholme 1998-12-29
5851135 System for real-time control of semiconductor wafer polishing Gurtej S. Sandhu 1998-12-22
5849632 Method of passivating semiconductor wafers Mark E. Tuttle 1998-12-15
5849628 Method of producing rough polysilicon by the use of pulsed plasma chemical vapor deposition and products produced by same Gurtej S. Sandhu 1998-12-15
5842909 System for real-time control of semiconductor wafer polishing including heater Gurtej S. Sandhu 1998-12-01
5824576 Method of forming complementary type conductive regions on a substrate Charles H. Dennison 1998-10-20
5795218 Polishing pad with elongated microcolumns Scott Meikle 1998-08-18
5786632 Semiconductor package Warren M. Farnworth, Alan G. Wood, John O. Jacobson 1998-07-28
5781022 Substrate having self limiting contacts for establishing an electrical connection with a semiconductor die Alan G. Wood, Warren M. Farnworth, Tim J. Corbett 1998-07-14
5777739 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers Gurtej S. Sandhu 1998-07-07
5767005 Method for fabricating a flash EEPROM Tyler Lowrey 1998-06-16
5762537 System for real-time control of semiconductor wafer polishing including heater Gurtej S. Sandhu 1998-06-09
5738562 Apparatus and method for planar end-point detection during chemical-mechanical polishing Gurtej S. Sandhu, Malcolm Grief 1998-04-14
5730642 System for real-time control of semiconductor wafer polishing including optical montoring Gurtej S. Sandhu 1998-03-24
5723382 Method of making a low-resistance contact to silicon having a titanium silicide interface, an amorphous titanium nitride barrier layer and a conductive plug Gurtej S. Sandhu, Tyler Lowrey 1998-03-03
5700180 System for real-time control of semiconductor wafer polishing Gurtej S. Sandhu 1997-12-23
5691235 Method of depositing tungsten nitride using a source gas comprising silicon Scott Meikle 1997-11-25
5658183 System for real-time control of semiconductor wafer polishing including optical monitoring Gurtej S. Sandhu 1997-08-19
5653619 Method to form self-aligned gate structures and focus rings Eugene H. Cloud, Tyler Lowrey, David A. Cathey, J. Brett Rolfson 1997-08-05
5651855 Method of making self aligned contacts to silicon substrates during the manufacture of integrated circuits Charles H. Dennison 1997-07-29
5643060 System for real-time control of semiconductor wafer polishing including heater Gurtej S. Sandhu 1997-07-01
5618381 Multiple step method of chemical-mechanical polishing which minimizes dishing Chris C. Yu 1997-04-08
5593927 Method for packaging semiconductor dice Warren M. Farnworth, Alan G. Wood, John O. Jacobson 1997-01-14