Issued Patents All Time
Showing 25 most recent of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9039474 | Magnetically adjusting color-converting materials within a matrix and associated devices, systems, and methods | Sameer S. Vadhavkar, Xiao Li | 2015-05-26 |
| 8728921 | Method for fabricating semiconductor components having lasered features containing dopants | Alan G. Wood | 2014-05-20 |
| 8530895 | Thinned semiconductor components having lasered features and method of fabrication | Alan G. Wood | 2013-09-10 |
| 8350863 | Methods and systems for improving resource utilization by delaying rendering of three dimensional graphics | Julian Petrov, Juan Rivera | 2013-01-08 |
| 8187983 | Methods for fabricating semiconductor components using thinning and back side laser processing | Alan G. Wood | 2012-05-29 |
| 8169436 | Methods and systems for remoting three dimensional graphics | Juan Rivera, Julian Petrov | 2012-05-01 |
| 8126156 | Calibrating at least one system microphone | David R. Ingalls, Lori A Cook, Deqing Hu, Scott Grasley | 2012-02-28 |
| 7511520 | Universal wafer carrier for wafer level die burn-in | Alan G. Wood, Warren M. Farnworth | 2009-03-31 |
| 7452732 | Comparing identifying indicia formed using laser marking techniques to an identifying indicia model | — | 2008-11-18 |
| 7362113 | Universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2008-04-22 |
| 7288953 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2007-10-30 |
| 7167012 | Universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2007-01-23 |
| 7167014 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2007-01-23 |
| 7161373 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2007-01-09 |
| 7141997 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2006-11-28 |
| 7112986 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2006-09-26 |
| 7112985 | Method for testing using a universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2006-09-26 |
| 6998860 | Method for burn-in testing semiconductor dice | Alan G. Wood, Gary L. Chadwick, Chender Huang, Larry D. Kinsman | 2006-02-14 |
| 6770906 | Semiconductor reliability test chip | Raymond P. Scholer, Fernando Gonzalez | 2004-08-03 |
| 6737882 | Method for universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2004-05-18 |
| 6683637 | Laser marking techniques | — | 2004-01-27 |
| 6538264 | Semiconductor reliability test chip | Raymond P. Scholer, Fernando Gonzalez | 2003-03-25 |
| 6535012 | Universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2003-03-18 |
| 6461690 | Laser marking techniques | — | 2002-10-08 |
| 6429890 | Laser marking techniques | — | 2002-08-06 |