Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
MG

Malcolm Grief — 34 Patents

Micron: 20 patents #900 of 6,374Top 15%
VUVersum Materials Us: 4 patents #43 of 174Top 25%
SPSpeedfam-Ipec: 3 patents #33 of 143Top 25%
Medtronic: 3 patents #2,650 of 6,367Top 45%
U.S. Philips: 2 patents #2,558 of 8,851Top 30%
SCSpeedfam Co.: 1 patents #48 of 105Top 50%
Phoenix, AZ: #135 of 6,660 inventorsTop 3%
Arizona: #805 of 32,909 inventorsTop 3%
Overall (All Time): #100,737 of 4,157,543Top 3%
34 Patents All Time
Malcolm Grief has been granted 34 US patents while listed as an inventor at Micron. The first was granted in 1990 and the most recent in August 2020. Malcolm Grief ranks #100,737 of 4,157,543 US inventors in our database (top 2.4%). Patent records list Malcolm Grief in Phoenix, AZ, US.

Issued Patents All Time

Showing 1–25 of 34 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10745589 Chemical mechanical polishing (CMP) of cobalt-containing substrate Xiaobo Shi, Joseph D. Rose, Timothy Joseph Clore, James Allen Schlueter, Mark Leonard O'Neill 2020-08-18
10669449 Composite abrasive particles for chemical mechanical planarization composition and method of use thereof Hongjun Zhou, Jo-Ann Theresa Schwartz, Xiaobo Shi, Krishna P. Murella, Steven Charles Winchester +5 more 2020-06-02
10109493 Composite abrasive particles for chemical mechanical planarization composition and method of use thereof Hongjun Zhou, Jo-Ann Theresa Schwartz, Xiaobo Shi, Krishna P. Murella, Steven Charles Winchester +5 more 2018-10-23
9978609 Low dishing copper chemical mechanical planarization Xiaobo Shi, James Allen Schlueter, Joseph D. Rose, Mark Leonard O'Neill 2018-05-22
9431312 Wafer-scale package including power source Richard J. O'Brien, John K. Day, Paul F. Gerrish, Michael F. Mattes, David A. Ruben 2016-08-30 $55,927,000
9318400 Wafer-scale package including power source Richard J. O'Brien, John K. Day, Paul F. Gerrish, Michael F. Mattes, David A. Ruben 2016-04-19 $33,708,000
8666505 Wafer-scale package including power source Richard J. O'Brien, John K. Day, Paul F. Gerrish, Michael F. Mattes, David A. Ruben 2014-03-04 $12,729,000
7330036 Engagement Probes Warren M. Farnworth 2008-02-12 $1,579,000
7116118 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Warren M. Farnworth, Gurtej S. Sandhu 2006-10-03 $1,273,000
7098475 Apparatuses configured to engage a conductive pad Warren M. Farnworth, Gurtej S. Sandhu 2006-08-29 $4,599,000
7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad Warren M. Farnworth, Gurtej S. Sandhu 2006-04-11 $3,047,000
6960115 Multiprobe detection system for chemical-mechanical planarization tool Matthew Weldon, Thomas Laursen, Paul Holzapfel, Mark Meloni, Robert A. Eaton 2005-11-01
6833727 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Warren M. Farnworth, Gurtej S. Sandhu 2004-12-21 $2,011,000
6805613 Multiprobe detection system for chemical-mechanical planarization tool Matthew Weldon, Thomas Laursen, Paul Holzapfel, Mark Meloni, Robert A. Eaton 2004-10-19
6686758 Engagement probe and apparatuses configured to engage a conductive pad Warren M. Farnworth, Gurtej S. Sandhu 2004-02-03 $3,037,000
6670819 Methods of engaging electrically conductive pads on a semiconductor substrate Warren M. Farnworth, Gurtej S. Sandhu 2003-12-30 $2,987,000
6657450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes Warren M. Farnworth, Gurtej S. Sandhu 2003-12-02 $2,846,000
6614249 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Warren M. Farnworth, Gurtej S. Sandhu 2003-09-02 $2,557,000
6573740 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate Warren M. Farnworth, Gurtej S. Sandhu 2003-06-03 $4,053,000
6555466 Two-step chemical-mechanical planarization for damascene structures on semiconductor wafers Thomas Laursen, Krishna P. Murella, Sanjay Basak 2003-04-29
6462571 Engagement probes Warren M. Farnworth, Gurtej S. Sandhu 2002-10-08 $2,680,000
6392426 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Warren M. Farnworth, Gurtej S. Sandhu 2002-05-21 $4,895,000
6387188 Pad conditioning for copper-based semiconductor wafers Thomas Laursen, Krishna P. Murella, Sanjay Basak 2002-05-14 $1,484,000
6380754 Removable electrical interconnect apparatuses including an engagement proble Warren M. Farnworth, Gurtej S. Sandhu 2002-04-30 $4,819,000
6127195 Methods of forming an apparatus for engaging electrically conductive pads and method of forming a removable electrical interconnect apparatus Warren M. Farnworth, Gurtej S. Sandhu 2000-10-03 $14,395,000