MW

Matthew Weldon

ML Metrosol Limited: 3 patents #2 of 5Top 40%
SP Speedfam-Ipec: 3 patents #33 of 143Top 25%
JS Jordan Valley Semiconductors: 1 patents #19 of 29Top 70%
Overall (All Time): #653,842 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8153987 Automated calibration methodology for VUV metrology system Jeffrey B. Hurst, Phillip Walsh, Cristian Rivas, Dale A. Harrison 2012-04-10
7663747 Contamination monitoring and control techniques for use with an optical metrology instrument Dale A. Harrison 2010-02-16
7622310 Contamination monitoring and control techniques for use with an optical metrology instrument Dale A. Harrison 2009-11-24
7342235 Contamination monitoring and control techniques for use with an optical metrology instrument Dale A. Harrison 2008-03-11
6960115 Multiprobe detection system for chemical-mechanical planarization tool Thomas Laursen, Malcolm Grief, Paul Holzapfel, Mark Meloni, Robert A. Eaton 2005-11-01
6805613 Multiprobe detection system for chemical-mechanical planarization tool Thomas Laursen, Malcolm Grief, Paul Holzapfel, Mark Meloni, Robert A. Eaton 2004-10-19
6447370 Inline metrology device 2002-09-10
5942704 Brush plectrum for stringed instruments 1999-08-24