MM

Mark Meloni

VI Verity Instruments: 12 patents #2 of 30Top 7%
SP Speedfam-Ipec: 9 patents #8 of 143Top 6%
OT Omnivision Technologies: 6 patents #147 of 604Top 25%
ED Empire Technology Development: 4 patents #125 of 547Top 25%
LV Lutronic Vision: 4 patents #4 of 16Top 25%
Overall (All Time): #97,668 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 25 most recent of 35 patents

Patent #TitleCo-InventorsDate
12178751 Laser ophthalmic treatment system with time-gated image capture component and electronic display Ezekiel Kruglick 2024-12-31
11690511 Polarization filtering for improved eye imaging Seth Adrian Miller 2023-07-04
11424115 Multimode configurable spectrometer Larry Arlos Bullock, John D. Corless, Richard J. Daignault, Jr., Mike Whelan 2022-08-23
10925482 Systems and methods for measuring postlens tear film thickness Seth Adrian Miller 2021-02-23
10925767 Laser doppler vibrometry for eye surface vibration measurement to determine cell damage Seth Adrian Miller 2021-02-23
10923324 Microwave plasma source 2021-02-16
10794763 Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer John D. Corless 2020-10-06
10679832 Microwave plasma source 2020-06-09
10365212 System and method for calibration of optical signals in semiconductor process systems Andrew Weeks Kueny, Mike Whelan, John D. Corless, Rick Daignault, Sean Lynes 2019-07-30
10002215 Arrayed imaging systems having improved alignment and associated methods Edward R. Dowski, Jr., Paulo E. X. Silveira, George C. Barnes, IV, Vladislav V. Chumachenko, Dennis W. Dobbs +17 more 2018-06-19
9801265 High dynamic range measurement system for process monitoring Larry Arlos Bullock, John D. Corless, Mike Whelan 2017-10-24
9772226 Referenced and stabilized optical measurement system John D. Corless, Andrew Weeks Kueny 2017-09-26
9418193 Arrayed imaging systems having improved alignment and associated methods Edward R. Dowski, Jr., Paulo E.X. Silvieri, George C. Barnes, IV, Vladislav V. Chumachenko, Dennis W. Dobbs +15 more 2016-08-16
9383323 Workpiece characterization system John D. Corless, Andrew Weeks Kueny, Mike Whelan 2016-07-05
9310250 High dynamic range measurement system for process monitoring Larry Arlos Bullock, John D. Corless, Mike Whelan 2016-04-12
9266201 System to facilitate disassembly of components Ezekiel Kruglick 2016-02-23
8807189 Removing and segregating components from printed circuit boards 2014-08-19
8780211 Optical alignment structures and associated methods George C. Barnes, IV, Goran M. Rauker 2014-07-15
8599301 Arrayed imaging systems having improved alignment and associated methods Edward R. Dowski, Jr., Paulo E. X. Silveira, George C. Barnes, IV, Vladislav V. Chumachenko, Dennis W. Dobbs +10 more 2013-12-03
8582115 Tunable and switchable multilayer optical devices Lu Gao, Paulo E. X. Silveira 2013-11-12
8572831 Disassembling an item by means of RF energy Ezekiel Kruglick 2013-11-05
8477195 Optical alignment structures and associated methods George C. Barnes, IV, Goran M. Rauker 2013-07-02
8366874 Removing and segregating components from printed circuit boards 2013-02-05
7589843 Self referencing heterodyne reflectometer and method for implementing Arun Ananth Aiyer 2009-09-15
7339682 Heterodyne reflectometer for film thickness monitoring and method for implementing Arun Ananth Aiyer, Kenneth C. Harvey, Andrew Weeks Kueny 2008-03-04