AA

Arun Ananth Aiyer

NI Nikon: 5 patents #754 of 2,493Top 35%
VI Verity Instruments: 4 patents #6 of 30Top 20%
A1 Applejack 199: 1 patents #10 of 16Top 65%
NP Nikon Precision: 1 patents #18 of 34Top 55%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
Overall (All Time): #317,236 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11452469 Optical device for non-invasive continuous monitoring of blood glucose level and HbA1c concentration 2022-09-27
11141087 Optical device for non-invasive continuous monitoring of blood glucose level and HbA1c concentration 2021-10-12
10584372 Sensor device and method for label-free detection of double strand nucleotides 2020-03-10
9316490 Method and system for measuring patterned substrates 2016-04-19
7589843 Self referencing heterodyne reflectometer and method for implementing Mark Meloni 2009-09-15
7545503 Self referencing heterodyne reflectometer and method for implementing 2009-06-09
7368206 Automated overlay metrology system Bernard Fay 2008-05-06
7339682 Heterodyne reflectometer for film thickness monitoring and method for implementing Mark Meloni, Kenneth C. Harvey, Andrew Weeks Kueny 2008-03-04
7084979 Non-contact optical profilometer with orthogonal beams 2006-08-01
6988060 Alignment simulation Paul Derek Coon, Henry K. Chau 2006-01-17
6768543 Wafer inspection apparatus with unique illumination methodology and method of operation 2004-07-27
5859698 Method and apparatus for macro defect detection using scattered light Henry K. Chau 1999-01-12
5838448 CMP variable angle in situ sensor Paul Derek Coon, Henry K. Chau 1998-11-17
5777729 Wafer inspection method and apparatus using diffracted light John H. McCoy, Kyoichi Suwa, Henry K. Chau 1998-07-07
5648848 Beam delivery apparatus and method for interferometry using rotatable polarization chucks 1997-07-15