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Mike Whelan — 13 Patents

VIVerity Instruments: 11 patents #3 of 30Top 10%
Lam Research: 2 patents #1,028 of 2,128Top 50%
University Of Texas System: 1 patents #2,951 of 6,559Top 45%
Coppell, TX: #50 of 495 inventorsTop 15%
Texas: #11,592 of 125,132 inventorsTop 10%
Overall (All Time): #362,438 of 4,157,543Top 9%
13 Patents All Time
Mike Whelan has been granted 13 US patents while listed as an inventor at Verity Instruments. The first was granted in 1994 and the most recent in October 2025. Mike Whelan ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Mike Whelan in Coppell, TX, US.

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12449622 Fiberoptical cable assemblies and interfaces for spectrometers Larry Arlos Bullock, Mark Meloni, William B. Elliott, David Friedersdorff 2025-10-21
11424115 Multimode configurable spectrometer Larry Arlos Bullock, John D. Corless, Richard J. Daignault, Jr., Mark Meloni 2022-08-23
10365212 System and method for calibration of optical signals in semiconductor process systems Andrew Weeks Kueny, Mark Meloni, John D. Corless, Rick Daignault, Sean Lynes 2019-07-30
9997325 Electron beam exciter for use in chemical analysis in processing systems Jimmy W. Hosch, Matthew J. Goeckner, Andrew Weeks Kueny, Kenneth C. Harvey, P.L. Stephan Thamban 2018-06-12
9801265 High dynamic range measurement system for process monitoring Larry Arlos Bullock, John D. Corless, Mark Meloni 2017-10-24
9383323 Workpiece characterization system Mark Meloni, John D. Corless, Andrew Weeks Kueny 2016-07-05
9310250 High dynamic range measurement system for process monitoring Larry Arlos Bullock, John D. Corless, Mark Meloni 2016-04-12
8125633 Calibration of a radiometric optical monitoring system used for fault detection and process monitoring Andrew Weeks Kueny, Kenneth C. Harvey, John D. Corless 2012-02-28
6642063 Apparatus for characterization of microelectronic feature quality Randall S. Mundt, Albert Lamm, Andrew Weeks Kueny 2003-11-04 $25,527,000
6432729 Method for characterization of microelectronic feature quality Randall S. Mundt, Albert Lamm, Andrew Weeks Kueny 2002-08-13 $3,652,000
5816476 Dual frequency power supply and transducer David Buice, Cesar Alfaro 1998-10-06
5595330 Power supply David Buice, Cesar Alfaro 1997-01-21
5364005 Ultrasonic transducer and mount Paul L. Whelan 1994-11-15

Nearby-Ranked Inventors

Jianping Shen13
Eric John Telfeyan13
George R. Breiwa, III13
Thomas Sugar13
Andrew Howley13
Howard Halpern13
Po-Yuan Wang13
Douglas Vanesko13
Tanuj Trivedi13