PW

Phillip Walsh

VA Vuv Analytics: 10 patents #3 of 4Top 75%
JS Jordan Valley Semiconductors: 5 patents #6 of 29Top 25%
NT N&K Technology: 4 patents #7 of 23Top 35%
ML Metrosol Limited: 3 patents #2 of 5Top 40%
General Motors: 1 patents #9,361 of 18,328Top 55%
Overall (All Time): #183,621 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10641749 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2020-05-05
10338040 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2019-07-02
10302607 Method for detailed and bulk classification analysis of complex samples using vacuum ultra-violet spectroscopy and gas chromatography Dale A. Harrison, Sean Jameson 2019-05-28
9976996 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2018-05-22
9891197 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2018-02-13
9696286 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2017-07-04
9465015 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2016-10-11
9310292 Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy Anthony T. Hayes, Dale A. Harrison 2016-04-12
9116158 Vacuum ultraviolet absorption spectroscopy system and method Dale A. Harrison, Anthony T. Hayes 2015-08-25
8867041 Optical vacuum ultra-violet wavelength nanoimprint metrology Jeffrey B. Hurst, Dale A. Harrison 2014-10-21
8773662 Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy Anthony T. Hayes, Dale A. Harrison 2014-07-08
8564780 Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces Dale A. Harrison 2013-10-22
8153987 Automated calibration methodology for VUV metrology system Jeffrey B. Hurst, Matthew Weldon, Cristian Rivas, Dale A. Harrison 2012-04-10
7990549 Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation 2011-08-02
7948631 Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths 2011-05-24
7663097 Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement Dale A. Harrison 2010-02-16
7511265 Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement Dale A. Harrison 2009-03-31
7349103 System and method for high intensity small spot optical metrology Mehdi Balooch, Marc Aho, Homan Amin, Abdul Rahim Forouhi, Guoguang Li 2008-03-25
7282703 Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement Dale A. Harrison 2007-10-16
7253909 Phase shift measurement using transmittance spectra Guoguang Li, Shuqiang Chen, Abdul Rahim Forouhi 2007-08-07
7212293 Optical determination of pattern feature parameters using a scalar model having effective optical properties Guoguang Li, Shuqiang Chen 2007-05-01
6891628 Method and apparatus for examining features on semi-transparent and transparent substrates Guoguang Li, Abdul Rahim Forouhi 2005-05-10
4654761 Periscopic vehicle lamp lens and lens arrangement including same 1987-03-31