Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10302607 | Method for detailed and bulk classification analysis of complex samples using vacuum ultra-violet spectroscopy and gas chromatography | Phillip Walsh, Dale A. Harrison | 2019-05-28 |
| 7481579 | Overlay metrology using X-rays | Boris Yokhin, Isaac Mazor, Alex Dikopoltsev | 2009-01-27 |