Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9390984 | X-ray inspection of bumps on a semiconductor substrate | Isaac Mazor, Alex Tokar, Matthew Wormington | 2016-07-12 |
| 8731138 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman +1 more | 2014-05-20 |
| 8437450 | Fast measurement of X-ray diffraction from tilted layers | John Leonard Wall, David N. Jacques, Alexander Krokhmal, Paul Ryan, Richard Thake Bytheway +2 more | 2013-05-07 |
| 8243878 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman +1 more | 2012-08-14 |
| 7804934 | Accurate measurement of layer dimensions using XRF | Dileep Agnihotri, Jeremy O'Dell, Isaac Mazor | 2010-09-28 |
| 7680243 | X-ray measurement of properties of nano-particles | Alexander Tokar, Alexander Krokhmal, Asher Peled, Dileep Agnihotri | 2010-03-16 |
| 7653174 | Inspection of small features using X-ray fluorescence | Isaac Mazor, David Berman, Alexander Tokar | 2010-01-26 |
| 7649978 | Automated selection of X-ray reflectometry measurement locations | Isaac Mazor, Alex Dikopoltsev, Dileep Agnihotri, Tzachi Rafaeli, Alex Tokar +2 more | 2010-01-19 |
| 7600916 | Target alignment for X-ray scattering measurements | Alexander Krokhmal, Asher Peled, David Berman | 2009-10-13 |
| 7551719 | Multifunction X-ray analysis system | Alexander Krokhmal, Tzachi Rafaeli, Isaac Mazor, Amos Gvirtzman | 2009-06-23 |
| 7481579 | Overlay metrology using X-rays | Isaac Mazor, Sean Jameson, Alex Dikopoltsev | 2009-01-27 |
| 7483513 | Measurement of properties of thin films on sidewalls | Isaac Mazor | 2009-01-27 |
| 7474732 | Calibration of X-ray reflectometry system | David Berman, Asher Peled, Dileep Agnihotri, Tachi Rafaeli | 2009-01-06 |
| 7321652 | Multi-detector EDXRD | Alexander Krokhmal, Alex Tokar | 2008-01-22 |
| 7245695 | Detection of dishing and tilting using X-ray fluorescence | Isaac Mazor, Alex Dikopoltsev, Tzachi Rafaeli, Alex Tokar | 2007-07-17 |
| 7231016 | Efficient measurement of diffuse X-ray reflections | David Berman, Isaac Mazor, Amos Gvirtzman | 2007-06-12 |
| 7120228 | Combined X-ray reflectometer and diffractometer | Isaac Mazor, Tzachi Rafaeli | 2006-10-10 |
| 7113566 | Enhancing resolution of X-ray measurements by sample motion | Asher Peled, Isaac Mazor | 2006-09-26 |
| 7110491 | Measurement of critical dimensions using X-ray diffraction in reflection mode | Isaac Mazor | 2006-09-19 |
| 7103142 | Material analysis using multiple X-ray reflectometry models | Dileep Agnihotri, Alex Dikopoltsev | 2006-09-05 |
| 7076024 | X-ray apparatus with dual monochromators | — | 2006-07-11 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections | David Berman, Isaac Mazor, Amos Gvirtzman | 2006-06-27 |
| 7035375 | X-ray scattering with a polychromatic source | — | 2006-04-25 |
| 6947520 | Beam centering and angle calibration for X-ray reflectometry | Isaac Mazor, David Berman | 2005-09-20 |
| 6907108 | Dual-wavelength x-ray monochromator | Isaac Mazor, Amos Gvirtzman | 2005-06-14 |