Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8731138 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Gennady Openganden, David Berman +1 more | 2014-05-20 |
| 8243878 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Gennady Openganden, David Berman +1 more | 2012-08-14 |
| 7551719 | Multifunction X-ray analysis system | Boris Yokhin, Alexander Krokhmal, Tzachi Rafaeli, Isaac Mazor | 2009-06-23 |
| 7231016 | Efficient measurement of diffuse X-ray reflections | David Berman, Isaac Mazor, Boris Yokhin | 2007-06-12 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections | David Berman, Isaac Mazor, Boris Yokhin | 2006-06-27 |
| 6907108 | Dual-wavelength x-ray monochromator | Boris Yokhin, Isaac Mazor | 2005-06-14 |
| 6895075 | X-ray reflectometry with small-angle scattering measurement | Boris Yokhin, Alexander Dikopoltsev, Tzachi Rafaeli | 2005-05-17 |
| 6680996 | Dual-wavelength X-ray reflectometry | Boris Yokhin, Isaac Mazor | 2004-01-20 |
| 6556652 | Measurement of critical dimensions using X-rays | Isaac Mazor, Boris Yokhin | 2003-04-29 |
| 6389102 | X-ray array detector | Isaac Mazor, Boris Yokhin, Ami Dovrat | 2002-05-14 |
| 6381303 | X-ray microanalyzer for thin films | Long Vu, Boris Yokhin, Isaac Mazor | 2002-04-30 |
| 6184686 | Contamination and residuals inspection system | Isaac Mazor, Reuven Duer | 2001-02-06 |
| 6108398 | X-ray microfluorescence analyzer | Isaac Mazor, Boris Yokhin | 2000-08-22 |