Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8731138 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, David Berman +1 more | 2014-05-20 |
| 8687766 | Enhancing accuracy of fast high-resolution X-ray diffractometry | Matthew Wormington, Alexander Krohmal, David Berman | 2014-04-01 |
| 8243878 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, David Berman +1 more | 2012-08-14 |