Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8731138 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden +1 more | 2014-05-20 |
| 8687766 | Enhancing accuracy of fast high-resolution X-ray diffractometry | Matthew Wormington, Alexander Krohmal, Gennady Openganden | 2014-04-01 |
| 8437450 | Fast measurement of X-ray diffraction from tilted layers | John Leonard Wall, David N. Jacques, Boris Yokhin, Alexander Krokhmal, Paul Ryan +2 more | 2013-05-07 |
| 8243878 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden +1 more | 2012-08-14 |
| 7653174 | Inspection of small features using X-ray fluorescence | Isaac Mazor, Boris Yokhin, Alexander Tokar | 2010-01-26 |
| 7649978 | Automated selection of X-ray reflectometry measurement locations | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Dileep Agnihotri, Tzachi Rafaeli +2 more | 2010-01-19 |
| 7600916 | Target alignment for X-ray scattering measurements | Boris Yokhin, Alexander Krokhmal, Asher Peled | 2009-10-13 |
| 7474732 | Calibration of X-ray reflectometry system | Asher Peled, Dileep Agnihotri, Tachi Rafaeli, Boris Yokhin | 2009-01-06 |
| 7453985 | Control of X-ray beam spot size | Isaac Mazor | 2008-11-18 |
| 7406153 | Control of X-ray beam spot size | — | 2008-07-29 |
| 7231016 | Efficient measurement of diffuse X-ray reflections | Isaac Mazor, Boris Yokhin, Amos Gvirtzman | 2007-06-12 |
| 7130376 | X-ray reflectometry of thin film layers with enhanced accuracy | Alex Dikopoltsev, Dileep Agnihotri | 2006-10-31 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections | Isaac Mazor, Boris Yokhin, Amos Gvirtzman | 2006-06-27 |
| 7062013 | X-ray reflectometry of thin film layers with enhanced accuracy | Alex Dikopoltsev, Dileep Agnihotri | 2006-06-13 |
| 6947520 | Beam centering and angle calibration for X-ray reflectometry | Boris Yokhin, Isaac Mazor | 2005-09-20 |
| 6895071 | XRR detector readout processing | Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor | 2005-05-17 |
| 6639968 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor | 2003-10-28 |
| 6512814 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor | 2003-01-28 |