Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7680243 | X-ray measurement of properties of nano-particles | Boris Yokhin, Alexander Krokhmal, Asher Peled, Dileep Agnihotri | 2010-03-16 |
| 7653174 | Inspection of small features using X-ray fluorescence | Isaac Mazor, David Berman, Boris Yokhin | 2010-01-26 |