Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12249059 | Navigation accuracy using camera coupled with detector assembly | Alexander Brandt, Dor Perry, Asher Peled, Matthew Wormington | 2025-03-11 |
| 12085521 | Small-angle X-ray scatterometry | Alex Dikopoltsev, Matthew Wormington, Yuri Vinshtein | 2024-09-10 |
| 12078604 | Monitoring properties of X-ray beam during X-ray analysis | Asher Peled | 2024-09-03 |
| 11781999 | Spot-size control in reflection-based and scatterometry-based X-ray metrology systems | — | 2023-10-10 |
| 11703464 | Small-angle x-ray scatterometry | Alex Dikopoltsev, Matthew Wormington, Yuri Vinshtein | 2023-07-18 |
| 11302508 | X-ray tube | John Leonard Wall | 2022-04-12 |
| 11181490 | Small-angle x-ray scatterometry | Alex Dikopoltsev, Matthew Wormington, Yuri Vinshtein | 2021-11-23 |
| 10976270 | X-ray detection optics for small-angle X-ray scatterometry | Matthew Wormington, Asher Peled | 2021-04-13 |
| 10976268 | X-ray source optics for small-angle X-ray scatterometry | Matthew Wormington, Yuri Vinshtein | 2021-04-13 |
| 10976269 | Wafer alignment for small-angle x-ray scatterometry | Yuri Vinshtein, Asher Peled, Guy Sheaffer, Matthew Wormington | 2021-04-13 |
| 8437450 | Fast measurement of X-ray diffraction from tilted layers | John Leonard Wall, David N. Jacques, Boris Yokhin, Paul Ryan, Richard Thake Bytheway +2 more | 2013-05-07 |
| 7680243 | X-ray measurement of properties of nano-particles | Boris Yokhin, Alexander Tokar, Asher Peled, Dileep Agnihotri | 2010-03-16 |
| 7600916 | Target alignment for X-ray scattering measurements | Boris Yokhin, Asher Peled, David Berman | 2009-10-13 |
| 7551719 | Multifunction X-ray analysis system | Boris Yokhin, Tzachi Rafaeli, Isaac Mazor, Amos Gvirtzman | 2009-06-23 |
| 7321652 | Multi-detector EDXRD | Boris Yokhin, Alex Tokar | 2008-01-22 |