Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829448 | Measurement of small features using XRF | Matthew Wormington, Isaac Mazor, Alex Dikopoltsev | 2017-11-28 |
| 9632043 | Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF | Isaac Mazor, Fouad Atrash, Olga Ostrovsky | 2017-04-25 |
| 9390984 | X-ray inspection of bumps on a semiconductor substrate | Isaac Mazor, Boris Yokhin, Matthew Wormington | 2016-07-12 |
| 9389192 | Estimation of XRF intensity from an array of micro-bumps | Alex Dikopoltsev, Isaac Mazor, Matthew Wormington | 2016-07-12 |
| 7649978 | Automated selection of X-ray reflectometry measurement locations | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Dileep Agnihotri, Tzachi Rafaeli +2 more | 2010-01-19 |
| 7321652 | Multi-detector EDXRD | Boris Yokhin, Alexander Krokhmal | 2008-01-22 |
| 7245695 | Detection of dishing and tilting using X-ray fluorescence | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Tzachi Rafaeli | 2007-07-17 |