Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11938450 | Membrane based in-line fouling monitor for performance tracking in reverse osmosis and Nano-filtration systems | Masoud Aghajani, Sriram Sambasivam, Joseph John Barelli, Ian Tonner | 2024-03-26 |
| 10864481 | Energy efficient low-fouling high-recovery reverse osmosis system for brackish water desalination | John Joseph Barelli | 2020-12-15 |
| 10583401 | Integrated ultrafiltration and reverse osmosis desalination systems | — | 2020-03-10 |
| 10518226 | Membranes with polydopamine coatings | Xiaofei Huang, Hua Li | 2019-12-31 |
| 7804934 | Accurate measurement of layer dimensions using XRF | Jeremy O'Dell, Isaac Mazor, Boris Yokhin | 2010-09-28 |
| 7680243 | X-ray measurement of properties of nano-particles | Boris Yokhin, Alexander Tokar, Alexander Krokhmal, Asher Peled | 2010-03-16 |
| 7649978 | Automated selection of X-ray reflectometry measurement locations | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Tzachi Rafaeli, Alex Tokar +2 more | 2010-01-19 |
| 7474732 | Calibration of X-ray reflectometry system | David Berman, Asher Peled, Tachi Rafaeli, Boris Yokhin | 2009-01-06 |
| 7130376 | X-ray reflectometry of thin film layers with enhanced accuracy | David Berman, Alex Dikopoltsev | 2006-10-31 |
| 7103142 | Material analysis using multiple X-ray reflectometry models | Alex Dikopoltsev, Boris Yokhin | 2006-09-05 |
| 7062013 | X-ray reflectometry of thin film layers with enhanced accuracy | David Berman, Alex Dikopoltsev | 2006-06-13 |