Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12339239 | X-ray diffraction imaging detector having multiple angled input faces | — | 2025-06-24 |
| 10816487 | Image contrast in X-ray topography imaging for defect inspection | Kevin Monroe Matney, Oliver Whear, John Leonard Wall, Matthew Wormington | 2020-10-27 |
| 8437450 | Fast measurement of X-ray diffraction from tilted layers | John Leonard Wall, David N. Jacques, Boris Yokhin, Alexander Krokhmal, Paul Ryan +2 more | 2013-05-07 |