Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816487 | Image contrast in X-ray topography imaging for defect inspection | Oliver Whear, Richard Thake Bytheway, John Leonard Wall, Matthew Wormington | 2020-10-27 |
| 6192103 | Fitting of X-ray scattering data using evolutionary algorithms | Matthew Wormington, Charles Panaccione, David Keith Bowen | 2001-02-20 |