Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8437450 | Fast measurement of X-ray diffraction from tilted layers | John Leonard Wall, Boris Yokhin, Alexander Krokhmal, Paul Ryan, Richard Thake Bytheway +2 more | 2013-05-07 |
| 7504078 | Continuous production of aligned carbon nanotubes | Rodney Andrews | 2009-03-17 |
| 7160531 | Process for the continuous production of aligned carbon nanotubes | Rodney Andrews | 2007-01-09 |