Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6895075 | X-ray reflectometry with small-angle scattering measurement | Alexander Dikopoltsev, Tzachi Rafaeli, Amos Gvirtzman | 2005-05-17 |
| 6895071 | XRR detector readout processing | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2005-05-17 |
| 6680996 | Dual-wavelength X-ray reflectometry | Isaac Mazor, Amos Gvirtzman | 2004-01-20 |
| 6639968 | X-ray reflectometer | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2003-10-28 |
| 6556652 | Measurement of critical dimensions using X-rays | Isaac Mazor, Amos Gvirtzman | 2003-04-29 |
| 6535575 | Pulsed X-ray reflectometer | — | 2003-03-18 |
| 6512814 | X-ray reflectometer | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2003-01-28 |
| 6453002 | Differential measurement of X-ray microfluorescence | Isaac Mazor, David Bar-On | 2002-09-17 |
| 6389102 | X-ray array detector | Isaac Mazor, Amos Gvirtzman, Ami Dovrat | 2002-05-14 |
| 6381303 | X-ray microanalyzer for thin films | Long Vu, Isaac Mazor, Amos Gvirtzman | 2002-04-30 |
| 6108398 | X-ray microfluorescence analyzer | Isaac Mazor, Amos Gvirtzman | 2000-08-22 |
| 6041095 | X-ray fluorescence analyzer | — | 2000-03-21 |