Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11656034 | Positive-pressure-withstanding high-power flat evaporator, processing methods thereof and flat loop heat pipe based on evaporator | Hongxing Zhang, Guanglong MAN, Shuai Wang, Dongxiao Liu | 2023-05-23 |
| 11568876 | Method and device for user registration, and electronic device | Fuxiang Li, Xiao LI | 2023-01-31 |
| 11187649 | Method for conducting optical measurement usingfull Mueller matrix ellipsometer | Tao Liu, Gaozeng Cui, Wei Xiong, Langfeng Wen | 2021-11-30 |
| 11168945 | Preparation method of loop heat pipe evaporator | Hongxing Zhang, Guanglong MAN, Jingtuzhi Li | 2021-11-09 |
| 9176048 | Normal incidence broadband spectroscopic polarimeter and optical measurement system | Tao Liu, Edgar Genio, Tiezhong Ma, Xiaolang Yan | 2015-11-03 |
| 9170156 | Normal-incidence broadband spectroscopic polarimeter containing reference beam and optical measurement system | Tao Liu, Jiangyan Zhao, Qingyang Guo, Edgar Genio, Tiezhong Ma +1 more | 2015-10-27 |
| 8767209 | Broadband polarization spectrometer with inclined incidence and optical measurement system | Tao Liu, Edgar Genio, Tiezhong Ma, Yan Xiaolang | 2014-07-01 |
| 8125641 | Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES) | — | 2012-02-28 |
| 7999936 | Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density | Abdul Rahim Forouhi, Erik Nackerud | 2011-08-16 |
| 7755775 | Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoring | — | 2010-07-13 |
| 7756677 | Implementation of rigorous coupled wave analysis having improved efficiency for characterization | — | 2010-07-13 |
| 7525672 | Efficient characterization of symmetrically illuminated symmetric 2-D gratings | Shuqiang Chen | 2009-04-28 |
| 7505147 | Efficient calculation of grating matrix elements for 2-D diffraction | Shuqiang Chen | 2009-03-17 |
| 7397554 | Apparatus and method for examining a disk-shaped sample on an X-Y-theta stage | Marc Aho | 2008-07-08 |
| 7391524 | System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines | Shuqiang Chen | 2008-06-24 |
| 7349103 | System and method for high intensity small spot optical metrology | Mehdi Balooch, Marc Aho, Homan Amin, Abdul Rahim Forouhi, Phillip Walsh | 2008-03-25 |
| 7289214 | System and method for measuring overlay alignment using diffraction gratings | Shuqiang Chen, Abdul Rahim Forouhi | 2007-10-30 |
| 7253909 | Phase shift measurement using transmittance spectra | Phillip Walsh, Shuqiang Chen, Abdul Rahim Forouhi | 2007-08-07 |
| 7212293 | Optical determination of pattern feature parameters using a scalar model having effective optical properties | Shuqiang Chen, Phillip Walsh | 2007-05-01 |
| 6982793 | Method and apparatus for using an alignment target with designed in offset | Weidong Yang, Roger R. Lowe-Webb, John D. Heaton | 2006-01-03 |
| 6891628 | Method and apparatus for examining features on semi-transparent and transparent substrates | Phillip Walsh, Abdul Rahim Forouhi | 2005-05-10 |
| 6580515 | Surface profiling using a differential interferometer | Rajeshwar Chhibber | 2003-06-17 |
| 6392756 | Method and apparatus for optically determining physical parameters of thin films deposited on a complex substrate | Hongwei Zhu, Dale A. Harrison, Abdul Rahim Forouhi, Weilu Xu | 2002-05-21 |
| 6379014 | Graded anti-reflective coatings for photolithography | Dale A. Harrison, Abdul Rahim Forouhi | 2002-04-30 |
| 6327035 | Method and apparatus for optically examining miniature patterns | Dale A. Harrison, Abdul Rahim Forouhi | 2001-12-04 |