Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940377 | Device and method for detecting a surface defect using interference between polarized lights | Lu Chen, Youwei Huang, Timmy Wang | 2024-03-26 |
| 11187649 | Method for conducting optical measurement usingfull Mueller matrix ellipsometer | Tao Liu, Guoguang Li, Wei Xiong, Langfeng Wen | 2021-11-30 |