Issued Patents All Time
Showing 26–34 of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6124721 | Method of engaging electrically conductive test pads on a semiconductor substrate | Warren M. Farnworth, Gurtej S. Sandhu | 2000-09-26 |
| 5738562 | Apparatus and method for planar end-point detection during chemical-mechanical polishing | Trung T. Doan, Gurtej S. Sandhu | 1998-04-14 |
| 5523697 | Testing apparatus for engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof | Warren M. Farnworth, Gurtej S. Sandhu | 1996-06-04 |
| 5514245 | Method for chemical planarization (CMP) of a semiconductor wafer to provide a planar surface free of microscratches | Trung T. Doan, Laurence D. Schultz | 1996-05-07 |
| 5326428 | Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability | Warren M. Farnworth, Gurtej S. Sandhu | 1994-07-05 |
| RE34583 | Method of forming a configuration of interconnections on a semiconductor device having a high integration density | Trung T. Doan, Hendrikus J. W. van Houtum, Josephus M. F. G. Van Laarhoven | 1994-04-12 |
| 5166093 | Method to reduce the reflectivity of a semi-conductor metallic surface | — | 1992-11-24 |
| 5136362 | Electrical contact with diffusion barrier | Trung T. Doan | 1992-08-04 |
| 4936950 | Method of forming a configuration of interconnections on a semiconductor device having a high integration density | Trung T. Doan, Leendert De Bruin, Harald Godon | 1990-06-26 |