RT

Randhir P. S. Thakur

Micron: 249 patents #21 of 6,345Top 1%
Applied Materials: 31 patents #353 of 7,310Top 5%
SG Steag Rtp Systems Gmbh: 5 patents #1 of 43Top 3%
MT Mattson Technology: 2 patents #87 of 230Top 40%
S3 Sandisk 3D: 1 patents #139 of 180Top 80%
📍 Fremont, CA: #5 of 9,298 inventorsTop 1%
🗺 California: #251 of 386,348 inventorsTop 1%
Overall (All Time): #1,402 of 4,157,543Top 1%
292
Patents All Time

Issued Patents All Time

Showing 126–150 of 292 patents

Patent #TitleCo-InventorsDate
6436818 Semiconductor structure having a doped conductive layer Yongjun Jeff Hu, Pai-Hung Pan, Er-Xuan Ping, Scott DeBoer 2002-08-20
6436847 Methods to form electronic devices 2002-08-20
6432841 Method for forming a dielectric Li Li, Richard C. Hawthorne 2002-08-13
6426306 Barrier layer fabrication methods Scott DeBoer 2002-07-30
6423649 Method and apparatus for stabilizing high pressure oxidation of a semiconductor device Daniel Gealy, Dave Chapek, Scott DeBoer, Husam N. Al-Shareef 2002-07-23
6417928 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2002-07-09
6403923 System for controlling the temperature of a reflective substrate during rapid heating Sing-Pin Tay, Yao Zhi Hu, Arnon Gat 2002-06-11
6404005 Methods of forming capacitors and related integrated circuitry Scott DeBoer, Klaus Schuegraf 2002-06-11
6399459 Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same Husam N. Al-Shareef, Scott DeBoer 2002-06-04
6400552 Capacitor with conductively doped Si-Ge alloy electrode Husam N. Al-Shareef, Scott DeBoer, F. Daniel Gealy 2002-06-04
6392284 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer Garry Mercaldi, Michael Nuttall 2002-05-21
6383875 Method of forming a transistor gate 2002-05-07
6380103 Rapid thermal etch and rapid thermal oxidation Fernando Gonzalez 2002-04-30
6368887 Method of monitoring a process of manufacturing a semiconductor wafer including hemispherical grain polysilicon Tyler Lowrey, Klaus Schuegraf 2002-04-09
6362086 Forming a conductive structure in a semiconductor device Ronald A. Weimer, Yongjun Jeff Hu, Pai-Hung Pan, Deepa Ratakonda, James A. Beck 2002-03-26
6359263 System for controlling the temperature of a reflective substrate during rapid heating Sing-Pin Tay, Yao Zhi Hu, Arnon Gat 2002-03-19
6359310 Shallow doped junctions with a variable profile gradation of dopants Fernando Gonzalez 2002-03-19
6355182 High selectivity etching process for oxides James Pan 2002-03-12
6350648 Formation of conductive rugged silicon Er-Xuan Ping 2002-02-26
6346455 Method to form a corrugated structure for enhanced capacitance Gordon A. Haller, Kirk D. Prall 2002-02-12
6337243 Semiconductor processing method of making a hemispherical grain (HSG) polysilicon layer Er-Xang Ping 2002-01-08
6333243 Method for growing field oxide to minimize birds' beak length Michael Nuttall, Pai-Hung Pan 2001-12-25
6333225 Integrated circuitry and methods of forming circuitry Klaus Schuegraf 2001-12-25
6327040 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2001-12-04
6326321 Methods of forming a layer of silicon nitride in semiconductor fabrication processes Scott DeBoer, John T. Moore, Mark Fischer 2001-12-04